Transverse beam profile diagnostics using point spread function dominated imaging with dedicated de-focusing

G. Kube, S. Bajt, Yu A. Popov, A. P. Potylitsyn, L. G. Sukhikh, W. Lauth

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Transverse beam profile diagnostics in electron accelerators is usually based on direct imaging of a beam spot via visible radiation (transition or synchrotron radiation). In this case the fundamental resolution limit is determined by radiation diffraction in the optical system. A method to achieve resolutions beyond the diffraction limit is to perform point spread function (PSF) dominated imaging, i.e. the recorded image is dominated by the resolution function of a point source (single electron), and with knowledge of the PSF the true image (beam spot) can be reconstructed. To overcome the limited dynamic range of PSF dominated imaging, a dedicated de-focusing of the optical system can be introduced. In order to verify the applicability of this method, a proof-of-principle experiment has been performed at the Mainz Microtron MAMI (University of Mainz, Germany) using optical transition radiation. Status and results of this experiment are presented.

Original languageEnglish
Title of host publicationIPAC 2013: Proceedings of the 4th International Particle Accelerator Conference
Pages488-490
Number of pages3
Publication statusPublished - 2013
Event4th International Particle Accelerator Conference, IPAC 2013 - Shanghai, China
Duration: 12 May 201317 May 2013

Other

Other4th International Particle Accelerator Conference, IPAC 2013
CountryChina
CityShanghai
Period12.5.1317.5.13

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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    Kube, G., Bajt, S., Popov, Y. A., Potylitsyn, A. P., Sukhikh, L. G., & Lauth, W. (2013). Transverse beam profile diagnostics using point spread function dominated imaging with dedicated de-focusing. In IPAC 2013: Proceedings of the 4th International Particle Accelerator Conference (pp. 488-490)