Abstract
A technique for increasing the information content of tomography imaging by using additional information about radiation absorption at various energies is considered. The positive effect of this technique is the determination of the distribution of various components over the sample volume. The technique differs in the fact that initial radiograms taking into account spectral information are obtained for one scanning without tuning irradiation conditions when using a spectrally sensitive matrix detector.
Original language | English |
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Pages (from-to) | 176-181 |
Number of pages | 6 |
Journal | Bulletin of the Lebedev Physics Institute |
Volume | 45 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1 Jun 2018 |
Keywords
- semiconductor matrix direct conversion detector
- spectral tomography
- X-ray radiation
- X-ray tube
ASJC Scopus subject areas
- Physics and Astronomy(all)