Time-of-Flight Optical Diagnostics of High-Power Pulsed Ion Beams

Abstract

Abstract: An ablation of a thin layer of surface contamination of the target that self-recovers after each pulse of a powerful ion beam has been used to control ion fluences. Using a time-of-flight optical spectrometer, the average speeds of the lightest components of the ablative plasma, which are hydrogen and carbon, have been measured. and the ion fluence has been determined by their difference.

Original language	English
Pages (from-to)	354-356
Number of pages	3
Journal	Technical Physics Letters
Volume	46
Issue number	4
DOIs	https://doi.org/10.1134/S1063785020040136
Publication status	Published - 1 Apr 2020

Keywords

ablative plasma
carbon
energy input
hydrogen
surface contamination

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1134/S1063785020040136

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Ryzhkov, V. A., Nechaev, B. A., & Padalko, V. N. (2020). Time-of-Flight Optical Diagnostics of High-Power Pulsed Ion Beams. Technical Physics Letters, 46(4), 354-356. https://doi.org/10.1134/S1063785020040136

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KW - carbon

KW - energy input

KW - hydrogen

KW - surface contamination

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