Threshold behavior of hard X-rays in resonant transition radiation from beryllium foils

M. Yu Andreyashkin, V. V. Kaplin, S. R. Uglov, V. N. Zabaev, I. Endo, T. Kobayashi

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Spectral distributions of X-ray resonance transition radiation (RTR) generated by 300, 500 and 700 MeV electrons in a target consisting of as many as 125 Be foils have been measured. When the electron energy increased from 500 to 700 MeV, a rapid growth of photon yield was observed in the spectral region h {combining short stroke overlay}ω = 5-30 keV, thus confirming the threshold effect of the on-set of the first harmonic of RTR.

Original languageEnglish
Pages (from-to)518-522
Number of pages5
JournalNuclear Inst. and Methods in Physics Research, A
Volume359
Issue number3
DOIs
Publication statusPublished - 15 May 1995

Fingerprint

Beryllium
beryllium
Metal foil
foils
Radiation
X rays
thresholds
Electrons
radiation
strokes
x rays
Photons
electron energy
harmonics
photons
electrons

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Threshold behavior of hard X-rays in resonant transition radiation from beryllium foils. / Andreyashkin, M. Yu; Kaplin, V. V.; Uglov, S. R.; Zabaev, V. N.; Endo, I.; Kobayashi, T.

In: Nuclear Inst. and Methods in Physics Research, A, Vol. 359, No. 3, 15.05.1995, p. 518-522.

Research output: Contribution to journalArticle

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AU - Endo, I.

AU - Kobayashi, T.

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