Three-dimensional analysis of transient thermal NDT problems by data simulation and processing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)

Abstract

The analysis of 2D and 3D numerical models are presented. The thermal nondestructive testing (NDT), it relates to the analysis of a spatial distribution of the temperature that appears over finite size subsurface defects. The ThermoCalc-2D and the ThermoCalc-3D software packages were used to solve the thermal NDT problem.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Pages152-163
Number of pages12
Volume4020
Publication statusPublished - 2000
EventThermosense XXII - Orlando, FL, USA
Duration: 24 Apr 200027 Apr 2000

Other

OtherThermosense XXII
CityOrlando, FL, USA
Period24.4.0027.4.00

Fingerprint

dimensional analysis
data simulation
Nondestructive examination
Processing
Software packages
Spatial distribution
Numerical models
spatial distribution
computer programs
Defects
defects
Temperature
temperature
Hot Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Vavilov, V. P. (2000). Three-dimensional analysis of transient thermal NDT problems by data simulation and processing. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4020, pp. 152-163). SPIE.

Three-dimensional analysis of transient thermal NDT problems by data simulation and processing. / Vavilov, Vladimir P.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4020 SPIE, 2000. p. 152-163.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Vavilov, VP 2000, Three-dimensional analysis of transient thermal NDT problems by data simulation and processing. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 4020, SPIE, pp. 152-163, Thermosense XXII, Orlando, FL, USA, 24.4.00.
Vavilov VP. Three-dimensional analysis of transient thermal NDT problems by data simulation and processing. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4020. SPIE. 2000. p. 152-163
Vavilov, Vladimir P. / Three-dimensional analysis of transient thermal NDT problems by data simulation and processing. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4020 SPIE, 2000. pp. 152-163
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