Thin SiO2-ZrO2 films prepared from solutions

R. V. Gryaznov, L. P. Borilo, V. V. Kozik, A. M. Shul'pekov

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    Abstract

    Thin SiO2-ZrO2 films were prepared from ethanolic solutions of Si(OC2H5)4 and ZrOCl2, and their refractive indices were measured. The storage behavior of the solutions and the reactions underlying the film-formation process were studied.

    Original languageEnglish
    Pages (from-to)698-701
    Number of pages4
    JournalInorganic Materials
    Volume37
    Issue number7
    DOIs
    Publication statusPublished - 1 Jan 2001

    ASJC Scopus subject areas

    • Chemical Engineering(all)
    • Inorganic Chemistry
    • Metals and Alloys
    • Materials Chemistry

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  • Cite this

    Gryaznov, R. V., Borilo, L. P., Kozik, V. V., & Shul'pekov, A. M. (2001). Thin SiO2-ZrO2 films prepared from solutions. Inorganic Materials, 37(7), 698-701. https://doi.org/10.1023/A:1017678124036