Thin SiO2-ZrO2 films prepared from solutions

R. V. Gryaznov, L. P. Borilo, V. V. Kozik, A. M. Shul'pekov

    Research output: Contribution to journal › Article

    1 Citation (Scopus)

    Abstract

    Thin SiO2-ZrO2 films were prepared from ethanolic solutions of Si(OC2H5)4 and ZrOCl2, and their refractive indices were measured. The storage behavior of the solutions and the reactions underlying the film-formation process were studied.

    Original languageEnglish
    Pages (from-to)698-701
    Number of pages4
    JournalInorganic Materials
    Volume37
    Issue number7
    DOIs
    Publication statusPublished - 1 Jan 2001

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    Refractive index

    ASJC Scopus subject areas

    • Chemical Engineering(all)
    • Inorganic Chemistry
    • Metals and Alloys
    • Materials Chemistry

    Cite this

    Gryaznov, R. V., Borilo, L. P., Kozik, V. V., & Shul'pekov, A. M. (2001). Thin SiO2-ZrO2 films prepared from solutions. Inorganic Materials, 37(7), 698-701. https://doi.org/10.1023/A:1017678124036

    Thin SiO2-ZrO2 films prepared from solutions. / Gryaznov, R. V.; Borilo, L. P.; Kozik, V. V.; Shul'pekov, A. M.

    In: Inorganic Materials, Vol. 37, No. 7, 01.01.2001, p. 698-701.

    Research output: Contribution to journal › Article

    Gryaznov, RV, Borilo, LP, Kozik, VV & Shul'pekov, AM 2001, 'Thin SiO2-ZrO2 films prepared from solutions', Inorganic Materials, vol. 37, no. 7, pp. 698-701. https://doi.org/10.1023/A:1017678124036
    Gryaznov RV, Borilo LP, Kozik VV, Shul'pekov AM. Thin SiO2-ZrO2 films prepared from solutions. Inorganic Materials. 2001 Jan 1;37(7):698-701. https://doi.org/10.1023/A:1017678124036
    Gryaznov, R. V. ; Borilo, L. P. ; Kozik, V. V. ; Shul'pekov, A. M. / Thin SiO2-ZrO2 films prepared from solutions. In: Inorganic Materials. 2001 ; Vol. 37, No. 7. pp. 698-701.
    @article{ec36d43810ff431988276a8747f2cbc8,
    title = "Thin SiO2-ZrO2 films prepared from solutions",
    abstract = "Thin SiO2-ZrO2 films were prepared from ethanolic solutions of Si(OC2H5)4 and ZrOCl2, and their refractive indices were measured. The storage behavior of the solutions and the reactions underlying the film-formation process were studied.",
    author = "Gryaznov, {R. V.} and Borilo, {L. P.} and Kozik, {V. V.} and Shul'pekov, {A. M.}",
    year = "2001",
    month = "1",
    day = "1",
    doi = "10.1023/A:1017678124036",
    language = "English",
    volume = "37",
    pages = "698--701",
    journal = "Inorganic Materials",
    issn = "0020-1685",
    publisher = "Maik Nauka-Interperiodica Publishing",
    number = "7",

    }

    TY - JOUR

    T1 - Thin SiO2-ZrO2 films prepared from solutions

    AU - Gryaznov, R. V.

    AU - Borilo, L. P.

    AU - Kozik, V. V.

    AU - Shul'pekov, A. M.

    PY - 2001/1/1

    Y1 - 2001/1/1

    N2 - Thin SiO2-ZrO2 films were prepared from ethanolic solutions of Si(OC2H5)4 and ZrOCl2, and their refractive indices were measured. The storage behavior of the solutions and the reactions underlying the film-formation process were studied.

    AB - Thin SiO2-ZrO2 films were prepared from ethanolic solutions of Si(OC2H5)4 and ZrOCl2, and their refractive indices were measured. The storage behavior of the solutions and the reactions underlying the film-formation process were studied.

    UR - http://www.scopus.com/inward/record.url?scp=9444282081&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=9444282081&partnerID=8YFLogxK

    U2 - 10.1023/A:1017678124036

    DO - 10.1023/A:1017678124036

    M3 - Article

    AN - SCOPUS:9444282081

    VL - 37

    SP - 698

    EP - 701

    JO - Inorganic Materials

    JF - Inorganic Materials

    SN - 0020-1685

    IS - 7

    ER -

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