Thickness dependence of refractive index and optical gap of PMMA layers prepared under electrical field

Vaclav Švorčík, O. Lyutakov, I. Huttel

Research output: Contribution to journalArticlepeer-review

48 Citations (Scopus)

Abstract

Optical parameters (refractive index, dispersion energy, optical gap) of polymethylmethacrylate (PMMA) layers prepared by spin coating and modified by electric field have been studied. Refractive index was measured using a refractometer, internal structure was investigated as a structural parameter (E d) within the One Oscillator Model. Optical gap width (E g opt) was assessed using Tauc Approximation from UV-Vis spectra. Surface morphology and roughness was investigated using an AFM. The electric field imposed during preparation of layers increases their refractive index. The highest increase in n (Δn = 0.042) was found for the thinnest PMMA layer (70 nm). Oriented layers have produced higher E g opt than non-oriented ones for all studied values of thickness. The electrical field applied at preparation of the oriented layer will not change its surface morphology and roughness.

Original languageEnglish
Pages (from-to)363-367
Number of pages5
JournalJournal of Materials Science: Materials in Electronics
Volume19
Issue number4
DOIs
Publication statusPublished - 1 Apr 2008
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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