Thickness dependence of refractive index and optical gap of PMMA layers prepared under electrical field

Vaclav Švorčík, O. Lyutakov, I. Huttel

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Optical parameters (refractive index, dispersion energy, optical gap) of polymethylmethacrylate (PMMA) layers prepared by spin coating and modified by electric field have been studied. Refractive index was measured using a refractometer, internal structure was investigated as a structural parameter (E d) within the One Oscillator Model. Optical gap width (E g opt) was assessed using Tauc Approximation from UV-Vis spectra. Surface morphology and roughness was investigated using an AFM. The electric field imposed during preparation of layers increases their refractive index. The highest increase in n (Δn = 0.042) was found for the thinnest PMMA layer (70 nm). Oriented layers have produced higher E g opt than non-oriented ones for all studied values of thickness. The electrical field applied at preparation of the oriented layer will not change its surface morphology and roughness.

Original languageEnglish
Pages (from-to)363-367
Number of pages5
JournalJournal of Materials Science: Materials in Electronics
Issue number4
Publication statusPublished - 1 Apr 2008
Externally publishedYes


ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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