Abstract
A method of silicate materials analysis based on X ray excitation followed by recording thermostimulated luminescence (TSL) of the materials is discussed. It is shown that the TSL method allows to perform an operative analysis of physicochemical processes at different stages of ceramic materials treatment including the sintering stage. The data of analyzing diopside ceramics using traditional methods and the TSL method are given.
Original language | English |
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Pages (from-to) | 20-22 |
Number of pages | 3 |
Journal | Steklo i Keramika |
Issue number | 1 |
Publication status | Published - Jan 1998 |
ASJC Scopus subject areas
- Ceramics and Composites