TY - GEN
T1 - Thermal non-destructive testing for the titanium implants
AU - Zhu, Qi Fang
AU - Sun, Ze Ming
AU - Ma, Tong Da
AU - Li, Pu
AU - Zhang, Dong Hui
AU - Vavilov, Vladimir P.
PY - 2013
Y1 - 2013
N2 - Active thermal NDT is a promising technique for the detection of structural defects in solids. In this paper, the results of the first-stage research devoted to infrared thermographic detection of cracks in titanium alloys are presented. The test results obtained show that the Fourier analysis is a convenient data processing technique in active thermal NDT. Images of phase are more noise-resistant and able to reveal deeper defects compared to images of amplitude. In application to the inspection of bottom-hole defects in 9.6 mm-thick Ti6Al4V titanium alloy samples, it has been found that a minimum detected defect should have diameter from one to two times greater than its depth.
AB - Active thermal NDT is a promising technique for the detection of structural defects in solids. In this paper, the results of the first-stage research devoted to infrared thermographic detection of cracks in titanium alloys are presented. The test results obtained show that the Fourier analysis is a convenient data processing technique in active thermal NDT. Images of phase are more noise-resistant and able to reveal deeper defects compared to images of amplitude. In application to the inspection of bottom-hole defects in 9.6 mm-thick Ti6Al4V titanium alloy samples, it has been found that a minimum detected defect should have diameter from one to two times greater than its depth.
KW - Defect
KW - Infrared thermography
KW - Phase image
KW - Titanium alloy Implant
UR - http://www.scopus.com/inward/record.url?scp=84886306975&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84886306975&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/AMR.785-786.52
DO - 10.4028/www.scientific.net/AMR.785-786.52
M3 - Conference contribution
AN - SCOPUS:84886306975
SN - 9783037858141
VL - 785-786
T3 - Advanced Materials Research
SP - 52
EP - 57
BT - Advanced Materials Research
T2 - 3rd International Conference on Chemical Engineering and Advanced Materials, CEAM 2013
Y2 - 6 July 2013 through 7 July 2013
ER -