Thermal damage at short electron bunches passage through a thin target

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The thin target could be used for beam diagnostics by means the radiation that is induced by interaction of beam particles with target matter. The electron beams used in modern applications (as, for example, modern FELs) have very large brightness, small emittance as well as very short bunch length. For example, the bunch length of XFEL is about of 25 um at bunch charge order of 1 nC and with electrons energy of 17.5 GeV. The passage of this powerful short bunches could damage the target or even completely destroy it. In the presented work the train of such bunches passages through the target is investigated. It is shown the target works in extreme regime close to phase transition temperature.

Original languageEnglish
Article number012030
JournalJournal of Physics: Conference Series
Volume732
Issue number1
DOIs
Publication statusPublished - 3 Aug 2016
Event11th International Symposium on Radiation from Relativistic Electrons in Periodic Structures, RREPS 2015 - Saint Petersburg, Russian Federation
Duration: 6 Sep 201511 Sep 2015

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damage
electrons
particle beams
emittance
brightness
transition temperature
electron beams
electron energy
radiation
interactions

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Thermal damage at short electron bunches passage through a thin target. / Babaev, A. A.; Gogolev, A. S.

In: Journal of Physics: Conference Series, Vol. 732, No. 1, 012030, 03.08.2016.

Research output: Contribution to journalArticle

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