Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography

Dmitry Dzhigaev, Tomaš Stankevič, Ilya Besedin, Sergey Lazarev, Anatoly Shabalin, Mikhail N. Strikhanov, Robert Feidenhans'L, Ivan A. Vartanyants

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)


X-ray Bragg ptychography (XBP) is an experimental technique for high-resolution strain mapping in a single nano- and mesoscopic crystalline structures. In this work we discuss the conditions that allow direct interpretation of the ptychographic reconstructions in terms of the strain distribution obtained from the two dimensional (2D) XBP. Simulations of the 2D XBP experiments under realistic experimental conditions are performed with a model of InGaN/GaN core-shell nanowire with low (1%) and high (30%) Indium concentrations in the shell.

Original languageEnglish
Title of host publicationX-Ray Nanoimaging
Subtitle of host publicationInstruments and Methods II
ISBN (Electronic)9781628417586
Publication statusPublished - 2015
EventX-Ray Nanoimaging: Instruments and Methods II - San Diego, United States
Duration: 12 Aug 201513 Aug 2015


ConferenceX-Ray Nanoimaging: Instruments and Methods II
CountryUnited States
CitySan Diego


  • Core-shell nanowires
  • X-ray Bragg ptychography

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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