The structure and properties of yttrium-stabilized zirconium dioxide ceramics treated by electron beam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The high-intensity electron-beam treatment of the submillisecond duration is used to treat the surface layer of sintered zirconium dioxide ceramics partially stabilized by yttrium. The electron beam irradiation parameters are obtained allowing the structural modification under a rapid solidification. It is shown that the structural modification of ceramics under melting conditions with the subsequent rapid solidification is accompanied by the formation of a sub-microcrystalline structure that fosters a multiple magnification (≈ 2 times) of the modified layer hardness.

Original languageEnglish
Title of host publicationMultifunctional Materials
Subtitle of host publicationDevelopment and Application
PublisherTrans Tech Publications Ltd
Pages53-57
Number of pages5
ISBN (Print)9783038357292
DOIs
Publication statusPublished - 1 Jan 2016
Event12th International Conference on Prospects of Fundamental Sciences Development, PFSD 2015 - Tomsk, Russian Federation
Duration: 21 Apr 201524 Apr 2015

Publication series

NameKey Engineering Materials
Volume683
ISSN (Print)1013-9826

Conference

Conference12th International Conference on Prospects of Fundamental Sciences Development, PFSD 2015
CountryRussian Federation
CityTomsk
Period21.4.1524.4.15

Keywords

  • Ceramics
  • Electron beam
  • Irradiation
  • Properties
  • Structure
  • Zirconium dioxide

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Tolkachev, O., Ivanov, Y., Petrikova, E., Petyukevich, M., & Panina, A. (2016). The structure and properties of yttrium-stabilized zirconium dioxide ceramics treated by electron beam. In Multifunctional Materials: Development and Application (pp. 53-57). (Key Engineering Materials; Vol. 683). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/KEM.683.53