The reliability of the power semiconductor module on the operating temperature

Evgeny V. Kravchenko, Dariya Yu Ivleva

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Abstract

A comparison of the intensities of the failure of a power unit with the real thermal regime of the device under conditions of natural convection and obtained by using statistical data analysis. The integrated assessment of reliability based on the methods of physics failures. The necessity of taking into account the actual non-stationary temperature fields to improve the reliability of the forecast operating life of power semiconductor devices.

Original languageEnglish
Article number01002
JournalMATEC Web of Conferences
Volume19
DOIs
Publication statusPublished - 15 Dec 2014
Event2nd International Youth Forum "Smart Grids" - Tomsk, Russian Federation
Duration: 6 Oct 201410 Oct 2014

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Engineering(all)

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