The power of in situ pulsed laser deposition synchrotron characterization for the detection of domain formation during growth of Ba0.5Sr 0.5TiO3 on MgO

Sondes Bauer, Sergey Lazarev, Alan Molinari, Andreas Breitenstein, Philipp Leufke, Robert Kruk, Horst Hahn, Tilo Baumbach

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

A highly sophisticated pulsed laser deposition (PLD) chamber has recently been installed at the NANO beamline at the synchrotron facility ANKA (Karlsruhe, Germany), which allows for comprehensive studies on the PLD growth process of dielectric, ferroelectric and ferromagnetic thin films in epitaxial oxide heterostructures or even multilayer systems by combining in situ reflective highenergy diffraction with the in situ synchrotron high-resolution X-ray diffraction and surface diffraction methods. The modularity of the in situ PLD chamber offers the opportunity to explore the microstructure of the grown thin films as a function of the substrate temperature, gas pressure, laser fluence and target-substrate separation distance. Ba0.5Sr 0.5TiO3 grown on MgO represents the first system that is grown in this in situ PLD chamber and studied by in situ X-ray reflectivity, in situ two-dimensional reciprocal space mapping of symmetric X-ray diffraction and acquisition of time-resolved diffraction profiles during the ablation process. In situ PLD synchrotron investigation has revealed the occurrence of structural distortion as well as domain formation and misfit dislocation which all depend strongly on the film thickness. The microstructure transformation has been accurately detected with a time resolution of 1 s. The acquisition of two-dimensional reciprocal space maps during the PLD growth has the advantage of simultaneously monitoring the changes of the crystalline structure as well as the formation of defects. The stability of the morphology during the PLD growth is demonstrated to be remarkably affected by the film thickness. A critical thickness for the domain formation in Ba0.5Sr0.5TiO 3 grown on MgO could be determined from the acquisition of time-resolved diffraction profiles during the PLD growth. A splitting of the diffraction peak into two distinguishable peaks has revealed a morphology change due to modification of the internal strain during growth.

Original languageEnglish
Pages (from-to)386-394
Number of pages9
JournalJournal of Synchrotron Radiation
Volume21
Issue number2
DOIs
Publication statusPublished - Mar 2014
Externally publishedYes

Fingerprint

Pulsed laser deposition
Synchrotrons
pulsed laser deposition
synchrotrons
Diffraction
diffraction
acquisition
chambers
Film thickness
film thickness
X ray diffraction
Thin films
modularity
microstructure
Microstructure
x rays
Substrates
thin films
profiles
Ablation

Keywords

  • 2D-reciprocal space mapping
  • growth of BaSrTiO
  • in situ pulsed laser deposition
  • in situ structural characterization
  • in situ synchrotron X-ray diffraction

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

The power of in situ pulsed laser deposition synchrotron characterization for the detection of domain formation during growth of Ba0.5Sr 0.5TiO3 on MgO. / Bauer, Sondes; Lazarev, Sergey; Molinari, Alan; Breitenstein, Andreas; Leufke, Philipp; Kruk, Robert; Hahn, Horst; Baumbach, Tilo.

In: Journal of Synchrotron Radiation, Vol. 21, No. 2, 03.2014, p. 386-394.

Research output: Contribution to journalArticle

Bauer, Sondes ; Lazarev, Sergey ; Molinari, Alan ; Breitenstein, Andreas ; Leufke, Philipp ; Kruk, Robert ; Hahn, Horst ; Baumbach, Tilo. / The power of in situ pulsed laser deposition synchrotron characterization for the detection of domain formation during growth of Ba0.5Sr 0.5TiO3 on MgO. In: Journal of Synchrotron Radiation. 2014 ; Vol. 21, No. 2. pp. 386-394.
@article{50fde4d730194515aa5259f924cf7052,
title = "The power of in situ pulsed laser deposition synchrotron characterization for the detection of domain formation during growth of Ba0.5Sr 0.5TiO3 on MgO",
abstract = "A highly sophisticated pulsed laser deposition (PLD) chamber has recently been installed at the NANO beamline at the synchrotron facility ANKA (Karlsruhe, Germany), which allows for comprehensive studies on the PLD growth process of dielectric, ferroelectric and ferromagnetic thin films in epitaxial oxide heterostructures or even multilayer systems by combining in situ reflective highenergy diffraction with the in situ synchrotron high-resolution X-ray diffraction and surface diffraction methods. The modularity of the in situ PLD chamber offers the opportunity to explore the microstructure of the grown thin films as a function of the substrate temperature, gas pressure, laser fluence and target-substrate separation distance. Ba0.5Sr 0.5TiO3 grown on MgO represents the first system that is grown in this in situ PLD chamber and studied by in situ X-ray reflectivity, in situ two-dimensional reciprocal space mapping of symmetric X-ray diffraction and acquisition of time-resolved diffraction profiles during the ablation process. In situ PLD synchrotron investigation has revealed the occurrence of structural distortion as well as domain formation and misfit dislocation which all depend strongly on the film thickness. The microstructure transformation has been accurately detected with a time resolution of 1 s. The acquisition of two-dimensional reciprocal space maps during the PLD growth has the advantage of simultaneously monitoring the changes of the crystalline structure as well as the formation of defects. The stability of the morphology during the PLD growth is demonstrated to be remarkably affected by the film thickness. A critical thickness for the domain formation in Ba0.5Sr0.5TiO 3 grown on MgO could be determined from the acquisition of time-resolved diffraction profiles during the PLD growth. A splitting of the diffraction peak into two distinguishable peaks has revealed a morphology change due to modification of the internal strain during growth.",
keywords = "2D-reciprocal space mapping, growth of BaSrTiO, in situ pulsed laser deposition, in situ structural characterization, in situ synchrotron X-ray diffraction",
author = "Sondes Bauer and Sergey Lazarev and Alan Molinari and Andreas Breitenstein and Philipp Leufke and Robert Kruk and Horst Hahn and Tilo Baumbach",
year = "2014",
month = "3",
doi = "10.1107/S1600577513034358",
language = "English",
volume = "21",
pages = "386--394",
journal = "Journal of Synchrotron Radiation",
issn = "0909-0495",
publisher = "International Union of Crystallography",
number = "2",

}

TY - JOUR

T1 - The power of in situ pulsed laser deposition synchrotron characterization for the detection of domain formation during growth of Ba0.5Sr 0.5TiO3 on MgO

AU - Bauer, Sondes

AU - Lazarev, Sergey

AU - Molinari, Alan

AU - Breitenstein, Andreas

AU - Leufke, Philipp

AU - Kruk, Robert

AU - Hahn, Horst

AU - Baumbach, Tilo

PY - 2014/3

Y1 - 2014/3

N2 - A highly sophisticated pulsed laser deposition (PLD) chamber has recently been installed at the NANO beamline at the synchrotron facility ANKA (Karlsruhe, Germany), which allows for comprehensive studies on the PLD growth process of dielectric, ferroelectric and ferromagnetic thin films in epitaxial oxide heterostructures or even multilayer systems by combining in situ reflective highenergy diffraction with the in situ synchrotron high-resolution X-ray diffraction and surface diffraction methods. The modularity of the in situ PLD chamber offers the opportunity to explore the microstructure of the grown thin films as a function of the substrate temperature, gas pressure, laser fluence and target-substrate separation distance. Ba0.5Sr 0.5TiO3 grown on MgO represents the first system that is grown in this in situ PLD chamber and studied by in situ X-ray reflectivity, in situ two-dimensional reciprocal space mapping of symmetric X-ray diffraction and acquisition of time-resolved diffraction profiles during the ablation process. In situ PLD synchrotron investigation has revealed the occurrence of structural distortion as well as domain formation and misfit dislocation which all depend strongly on the film thickness. The microstructure transformation has been accurately detected with a time resolution of 1 s. The acquisition of two-dimensional reciprocal space maps during the PLD growth has the advantage of simultaneously monitoring the changes of the crystalline structure as well as the formation of defects. The stability of the morphology during the PLD growth is demonstrated to be remarkably affected by the film thickness. A critical thickness for the domain formation in Ba0.5Sr0.5TiO 3 grown on MgO could be determined from the acquisition of time-resolved diffraction profiles during the PLD growth. A splitting of the diffraction peak into two distinguishable peaks has revealed a morphology change due to modification of the internal strain during growth.

AB - A highly sophisticated pulsed laser deposition (PLD) chamber has recently been installed at the NANO beamline at the synchrotron facility ANKA (Karlsruhe, Germany), which allows for comprehensive studies on the PLD growth process of dielectric, ferroelectric and ferromagnetic thin films in epitaxial oxide heterostructures or even multilayer systems by combining in situ reflective highenergy diffraction with the in situ synchrotron high-resolution X-ray diffraction and surface diffraction methods. The modularity of the in situ PLD chamber offers the opportunity to explore the microstructure of the grown thin films as a function of the substrate temperature, gas pressure, laser fluence and target-substrate separation distance. Ba0.5Sr 0.5TiO3 grown on MgO represents the first system that is grown in this in situ PLD chamber and studied by in situ X-ray reflectivity, in situ two-dimensional reciprocal space mapping of symmetric X-ray diffraction and acquisition of time-resolved diffraction profiles during the ablation process. In situ PLD synchrotron investigation has revealed the occurrence of structural distortion as well as domain formation and misfit dislocation which all depend strongly on the film thickness. The microstructure transformation has been accurately detected with a time resolution of 1 s. The acquisition of two-dimensional reciprocal space maps during the PLD growth has the advantage of simultaneously monitoring the changes of the crystalline structure as well as the formation of defects. The stability of the morphology during the PLD growth is demonstrated to be remarkably affected by the film thickness. A critical thickness for the domain formation in Ba0.5Sr0.5TiO 3 grown on MgO could be determined from the acquisition of time-resolved diffraction profiles during the PLD growth. A splitting of the diffraction peak into two distinguishable peaks has revealed a morphology change due to modification of the internal strain during growth.

KW - 2D-reciprocal space mapping

KW - growth of BaSrTiO

KW - in situ pulsed laser deposition

KW - in situ structural characterization

KW - in situ synchrotron X-ray diffraction

UR - http://www.scopus.com/inward/record.url?scp=84894459782&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84894459782&partnerID=8YFLogxK

U2 - 10.1107/S1600577513034358

DO - 10.1107/S1600577513034358

M3 - Article

AN - SCOPUS:84894459782

VL - 21

SP - 386

EP - 394

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

SN - 0909-0495

IS - 2

ER -