The potential of flat curvilinear DOE as a key element of future integrated diffractive optics and information protected element

I. V. Minin, Oleg V. Minin, D. Prather, S. Shi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The results of a detailed simulation obtained using a parallel FDTD method and the application of the proposed device to focusing and frequency-selective properties of flat conical diffractive elements in THz waveband are described. Introduction of novels diffractive element in the THz waveband is described. If offers the potential to realize novel types of devices for communications, sensing, integrated optics, networks, transmission lines, information protecting systems and so on. To this end, diffractive planar elements fabricated on non-flat surfaces make it possible to enrich the "pool of devices" for applications including integrated optics at different waveband, including THz, and to design elements with novel properties and potentials.

Original languageEnglish
Title of host publicationProceedings of the 5th IEEE-Russia Conference - 2005 Microwave Electronics: Measurements, Identification, Applications, MEMIA '05
Pages186-193
Number of pages8
Volume2005
Publication statusPublished - 2005
Externally publishedYes
Event5th IEEE International Conference on Microwave Electronics: Measurements, Identification, Applications 2005, MEMIA '05 - Novosibirsk, Russian Federation
Duration: 13 Dec 200515 Dec 2005

Conference

Conference5th IEEE International Conference on Microwave Electronics: Measurements, Identification, Applications 2005, MEMIA '05
CountryRussian Federation
CityNovosibirsk
Period13.12.0515.12.05

Keywords

  • Curvilinear surface
  • DOE
  • Integrated diffractive optic
  • THz wave

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Minin, I. V., Minin, O. V., Prather, D., & Shi, S. (2005). The potential of flat curvilinear DOE as a key element of future integrated diffractive optics and information protected element. In Proceedings of the 5th IEEE-Russia Conference - 2005 Microwave Electronics: Measurements, Identification, Applications, MEMIA '05 (Vol. 2005, pp. 186-193). [1716983]