The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation

G. Naumenko, A. Potylitsyn, S. Araki, A. Aryshev, H. Hayano, Pavel Vladimirovich Karataev, T. Muto, J. Urakawa, M. Ross, D. Cline, Y. Fukui, R. Hamatsu

Research School of High-Energy Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A new method based on diffraction radiation emitted by charged particles moving through a slit between two flat rectangular plates inclined with respect to each other around the axis perpendicular to the slit has been suggested. The theoretical model for calculating the ODR radiation from such targets (including focusing by cylindrical lens) is presented. It is shown that the sensitivity of this method does not depend on the Lorenz-factor directly. The target with the "dis-phased" angle 6.2 milliradians and the slit width 425 microns was manufactured for experimental test. Some preliminary experimental results are presented.

Original language	English
Title of host publication	Proceedings of the IEEE Particle Accelerator Conference
Pages	404-406
Number of pages	3
Volume	2005
DOIs	https://doi.org/10.1109/PAC.2005.1590447
Publication status	Published - 2005
Event	Particle Accelerator Conference, PAC 2005 - Knoxville, TN, United States Duration: 16 May 2005 → 20 May 2005

Other

Other	Particle Accelerator Conference, PAC 2005
Country	United States
City	Knoxville, TN
Period	16.5.05 → 20.5.05

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ASJC Scopus subject areas

Engineering(all)

Cite this

Naumenko, G., Potylitsyn, A., Araki, S., Aryshev, A., Hayano, H., Karataev, P. V., ... Hamatsu, R. (2005). The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. In Proceedings of the IEEE Particle Accelerator Conference (Vol. 2005, pp. 404-406). [1590447] https://doi.org/10.1109/PAC.2005.1590447

The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. / Naumenko, G.; Potylitsyn, A.; Araki, S.; Aryshev, A.; Hayano, H.; Karataev, Pavel Vladimirovich; Muto, T.; Urakawa, J.; Ross, M.; Cline, D.; Fukui, Y.; Hamatsu, R.

Proceedings of the IEEE Particle Accelerator Conference. Vol. 2005 2005. p. 404-406 1590447.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Naumenko, G , Potylitsyn, A, Araki, S, Aryshev, A, Hayano, H, Karataev, PV, Muto, T, Urakawa, J, Ross, M, Cline, D, Fukui, Y & Hamatsu, R 2005, The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. in Proceedings of the IEEE Particle Accelerator Conference. vol. 2005, 1590447, pp. 404-406, Particle Accelerator Conference, PAC 2005, Knoxville, TN, United States, 16.5.05. https://doi.org/10.1109/PAC.2005.1590447

Naumenko, G. ; Potylitsyn, A. ; Araki, S. ; Aryshev, A. ; Hayano, H. ; Karataev, Pavel Vladimirovich ; Muto, T. ; Urakawa, J. ; Ross, M. ; Cline, D. ; Fukui, Y. ; Hamatsu, R. / The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. Proceedings of the IEEE Particle Accelerator Conference. Vol. 2005 2005. pp. 404-406

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AU - Karataev, Pavel Vladimirovich

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Access to Document

10.1109/PAC.2005.1590447