The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation

G. Naumenko, A. Potylitsyn, S. Araki, A. Aryshev, H. Hayano, Pavel Vladimirovich Karataev, T. Muto, J. Urakawa, M. Ross, D. Cline, Y. Fukui, R. Hamatsu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new method based on diffraction radiation emitted by charged particles moving through a slit between two flat rectangular plates inclined with respect to each other around the axis perpendicular to the slit has been suggested. The theoretical model for calculating the ODR radiation from such targets (including focusing by cylindrical lens) is presented. It is shown that the sensitivity of this method does not depend on the Lorenz-factor directly. The target with the "dis-phased" angle 6.2 milliradians and the slit width 425 microns was manufactured for experimental test. Some preliminary experimental results are presented.

Original languageEnglish
Title of host publicationProceedings of the IEEE Particle Accelerator Conference
Pages404-406
Number of pages3
Volume2005
DOIs
Publication statusPublished - 2005
EventParticle Accelerator Conference, PAC 2005 - Knoxville, TN, United States
Duration: 16 May 200520 May 2005

Other

OtherParticle Accelerator Conference, PAC 2005
CountryUnited States
CityKnoxville, TN
Period16.5.0520.5.05

Fingerprint

Electron beams
Diffraction
Radiation
Charged particles
Lenses

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Naumenko, G., Potylitsyn, A., Araki, S., Aryshev, A., Hayano, H., Karataev, P. V., ... Hamatsu, R. (2005). The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. In Proceedings of the IEEE Particle Accelerator Conference (Vol. 2005, pp. 404-406). [1590447] https://doi.org/10.1109/PAC.2005.1590447

The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. / Naumenko, G.; Potylitsyn, A.; Araki, S.; Aryshev, A.; Hayano, H.; Karataev, Pavel Vladimirovich; Muto, T.; Urakawa, J.; Ross, M.; Cline, D.; Fukui, Y.; Hamatsu, R.

Proceedings of the IEEE Particle Accelerator Conference. Vol. 2005 2005. p. 404-406 1590447.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Naumenko, G, Potylitsyn, A, Araki, S, Aryshev, A, Hayano, H, Karataev, PV, Muto, T, Urakawa, J, Ross, M, Cline, D, Fukui, Y & Hamatsu, R 2005, The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. in Proceedings of the IEEE Particle Accelerator Conference. vol. 2005, 1590447, pp. 404-406, Particle Accelerator Conference, PAC 2005, Knoxville, TN, United States, 16.5.05. https://doi.org/10.1109/PAC.2005.1590447
Naumenko G, Potylitsyn A, Araki S, Aryshev A, Hayano H, Karataev PV et al. The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. In Proceedings of the IEEE Particle Accelerator Conference. Vol. 2005. 2005. p. 404-406. 1590447 https://doi.org/10.1109/PAC.2005.1590447
Naumenko, G. ; Potylitsyn, A. ; Araki, S. ; Aryshev, A. ; Hayano, H. ; Karataev, Pavel Vladimirovich ; Muto, T. ; Urakawa, J. ; Ross, M. ; Cline, D. ; Fukui, Y. ; Hamatsu, R. / The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. Proceedings of the IEEE Particle Accelerator Conference. Vol. 2005 2005. pp. 404-406
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