Abstract
By scanning and transmission electron diffraction microscopy method the analysis of structure-phase states and defect substructure of silumin subjected to high-intensity electron beam irradiation in various regimes and subsequent fatigue loading up to failure was carried out. It is revealed that the sources of fatigue microcracks are silicon plates of micron and submicron sizes that are not soluble in electron beam processing. The possible reasons of the silumin fatigue life increase under electron-beam treatment are discussed.
| Original language | English |
|---|---|
| Title of host publication | Key Engineering Materials |
| Publisher | Trans Tech Publications Ltd |
| Pages | 655-659 |
| Number of pages | 5 |
| Volume | 675-676 |
| ISBN (Print) | 9783038356837 |
| DOIs | |
| Publication status | Published - 2016 |
| Event | 2nd International Conference on Applied Physics and Material Applications, ICAPMA 2015 - Pattaya, Thailand Duration: 28 May 2015 → 30 May 2015 |
Publication series
| Name | Key Engineering Materials |
|---|---|
| Volume | 675-676 |
| ISSN (Print) | 10139826 |
Other
| Other | 2nd International Conference on Applied Physics and Material Applications, ICAPMA 2015 |
|---|---|
| Country | Thailand |
| City | Pattaya |
| Period | 28.5.15 → 30.5.15 |
Fingerprint
Keywords
- Al-Si alloy
- Cellular crystallization
- Electron beam
- High-cycle fatigue
- Irradiation
- Structure
- Surface
ASJC Scopus subject areas
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering
Cite this
The influence of electron beam treatment on Al-Si alloy structure destroyed at high-cycle fatigue. / Konovalov, Sergey; Alsaraeva, Krestina; Gromov, Viktor; Ivanov, Yurii; Semina, Olga.
Key Engineering Materials. Vol. 675-676 Trans Tech Publications Ltd, 2016. p. 655-659 (Key Engineering Materials; Vol. 675-676).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - The influence of electron beam treatment on Al-Si alloy structure destroyed at high-cycle fatigue
AU - Konovalov, Sergey
AU - Alsaraeva, Krestina
AU - Gromov, Viktor
AU - Ivanov, Yurii
AU - Semina, Olga
PY - 2016
Y1 - 2016
N2 - By scanning and transmission electron diffraction microscopy method the analysis of structure-phase states and defect substructure of silumin subjected to high-intensity electron beam irradiation in various regimes and subsequent fatigue loading up to failure was carried out. It is revealed that the sources of fatigue microcracks are silicon plates of micron and submicron sizes that are not soluble in electron beam processing. The possible reasons of the silumin fatigue life increase under electron-beam treatment are discussed.
AB - By scanning and transmission electron diffraction microscopy method the analysis of structure-phase states and defect substructure of silumin subjected to high-intensity electron beam irradiation in various regimes and subsequent fatigue loading up to failure was carried out. It is revealed that the sources of fatigue microcracks are silicon plates of micron and submicron sizes that are not soluble in electron beam processing. The possible reasons of the silumin fatigue life increase under electron-beam treatment are discussed.
KW - Al-Si alloy
KW - Cellular crystallization
KW - Electron beam
KW - High-cycle fatigue
KW - Irradiation
KW - Structure
KW - Surface
UR - http://www.scopus.com/inward/record.url?scp=84958169990&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84958169990&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/KEM.675-676.655
DO - 10.4028/www.scientific.net/KEM.675-676.655
M3 - Conference contribution
AN - SCOPUS:84958169990
SN - 9783038356837
VL - 675-676
T3 - Key Engineering Materials
SP - 655
EP - 659
BT - Key Engineering Materials
PB - Trans Tech Publications Ltd
ER -