The feasibility of usage TiN and CrN barrier sublayers for improving the adhesion of polycrystalline diamond films on WC-Co hard alloys

S. A. Linnik, A. V. Gaydaychuk, E. Y. Barishnikov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In the present study, the influence of Chromium nitride (CrN) and Titanium nitride (TiN) sublayers on the adhesion of polycrystalline diamond films applied to WC-Co substrates was investigated. CrN and TiN layers were deposited on WC-Co substrates by magnetron sputtering in Ar/N2 atmosphere. Synthesis of diamond films was conducted in an AC abnormal glow discharge CVD reactor. The phase composition of the films was characterized by small-angle X-ray diffraction (XRD). The adhesion of diamond films was compared by analysis of Rockwell indentation imprints. It was found that TiN does not react with the carbon of the diamond film while CrN almost completely converted into chromium carbide (Cr3C2). Adhesion tests showed that the efficiency of these sublayers usage is substantially lower than using a Murakami and HNO3/H2O pretreatment.

Original languageEnglish
Title of host publicationHigh Technology
Subtitle of host publicationResearch and Applications, 2015
PublisherTrans Tech Publications Ltd
Pages583-586
Number of pages4
ISBN (Print)9783038357087
DOIs
Publication statusPublished - 1 Jan 2016
Event4th International Conference for Young Scientists High Technology: Research and Applications, HTRA 2015 - Tomsk, Russian Federation
Duration: 21 Apr 201524 Apr 2015

Publication series

NameKey Engineering Materials
Volume685
ISSN (Print)1013-9826

Conference

Conference4th International Conference for Young Scientists High Technology: Research and Applications, HTRA 2015
CountryRussian Federation
CityTomsk
Period21.4.1524.4.15

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Keywords

  • Adhesion sublayer
  • CVD diamond films
  • Hard alloy
  • Magnetron sputtering

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Linnik, S. A., Gaydaychuk, A. V., & Barishnikov, E. Y. (2016). The feasibility of usage TiN and CrN barrier sublayers for improving the adhesion of polycrystalline diamond films on WC-Co hard alloys. In High Technology: Research and Applications, 2015 (pp. 583-586). (Key Engineering Materials; Vol. 685). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/KEM.685.583