The electron pinch lifetime in high-current rod pinch diodes

S. Ya Belomyttsev, V. V. Ryzhov

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

In high-current coaxial diodes with rod anode (rod pinch diodes), the current of the magnetic self-insulation in the gap is approximately two times greater than the critical magnetic insulation current (JS ≈ 2JC). Based on this fact, a model is proposed according to which a quasistationary electron pinch state in such diodes is explained by a change in the gap magnetic insulation conditions caused by the pinch formation. This circumstance can be used to evaluate the pinch lifetime Δt. The Δt values calculated using the oscillograms measured on the Gamble I accelerator agree satisfactorily with the values experimentally determined in a coaxial rod pinch diode.

Original languageEnglish
Pages (from-to)608-610
Number of pages3
JournalTechnical Physics Letters
Volume27
Issue number7
DOIs
Publication statusPublished - Jul 2001

Fingerprint

high current
rods
diodes
insulation
life (durability)
electrons
oscillographs
anodes
accelerators

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

The electron pinch lifetime in high-current rod pinch diodes. / Belomyttsev, S. Ya; Ryzhov, V. V.

In: Technical Physics Letters, Vol. 27, No. 7, 07.2001, p. 608-610.

Research output: Contribution to journalArticle

@article{10eea719af724600a00c1ca45b55f4a7,
title = "The electron pinch lifetime in high-current rod pinch diodes",
abstract = "In high-current coaxial diodes with rod anode (rod pinch diodes), the current of the magnetic self-insulation in the gap is approximately two times greater than the critical magnetic insulation current (JS ≈ 2JC). Based on this fact, a model is proposed according to which a quasistationary electron pinch state in such diodes is explained by a change in the gap magnetic insulation conditions caused by the pinch formation. This circumstance can be used to evaluate the pinch lifetime Δt. The Δt values calculated using the oscillograms measured on the Gamble I accelerator agree satisfactorily with the values experimentally determined in a coaxial rod pinch diode.",
author = "Belomyttsev, {S. Ya} and Ryzhov, {V. V.}",
year = "2001",
month = "7",
doi = "10.1134/1.1388960",
language = "English",
volume = "27",
pages = "608--610",
journal = "Technical Physics Letters",
issn = "1063-7850",
publisher = "Maik Nauka-Interperiodica Publishing",
number = "7",

}

TY - JOUR

T1 - The electron pinch lifetime in high-current rod pinch diodes

AU - Belomyttsev, S. Ya

AU - Ryzhov, V. V.

PY - 2001/7

Y1 - 2001/7

N2 - In high-current coaxial diodes with rod anode (rod pinch diodes), the current of the magnetic self-insulation in the gap is approximately two times greater than the critical magnetic insulation current (JS ≈ 2JC). Based on this fact, a model is proposed according to which a quasistationary electron pinch state in such diodes is explained by a change in the gap magnetic insulation conditions caused by the pinch formation. This circumstance can be used to evaluate the pinch lifetime Δt. The Δt values calculated using the oscillograms measured on the Gamble I accelerator agree satisfactorily with the values experimentally determined in a coaxial rod pinch diode.

AB - In high-current coaxial diodes with rod anode (rod pinch diodes), the current of the magnetic self-insulation in the gap is approximately two times greater than the critical magnetic insulation current (JS ≈ 2JC). Based on this fact, a model is proposed according to which a quasistationary electron pinch state in such diodes is explained by a change in the gap magnetic insulation conditions caused by the pinch formation. This circumstance can be used to evaluate the pinch lifetime Δt. The Δt values calculated using the oscillograms measured on the Gamble I accelerator agree satisfactorily with the values experimentally determined in a coaxial rod pinch diode.

UR - http://www.scopus.com/inward/record.url?scp=0035536079&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035536079&partnerID=8YFLogxK

U2 - 10.1134/1.1388960

DO - 10.1134/1.1388960

M3 - Article

VL - 27

SP - 608

EP - 610

JO - Technical Physics Letters

JF - Technical Physics Letters

SN - 1063-7850

IS - 7

ER -