Abstract
In high-current coaxial diodes with rod anode (rod pinch diodes), the current of the magnetic self-insulation in the gap is approximately two times greater than the critical magnetic insulation current (JS ≈ 2JC). Based on this fact, a model is proposed according to which a quasistationary electron pinch state in such diodes is explained by a change in the gap magnetic insulation conditions caused by the pinch formation. This circumstance can be used to evaluate the pinch lifetime Δt. The Δt values calculated using the oscillograms measured on the Gamble I accelerator agree satisfactorily with the values experimentally determined in a coaxial rod pinch diode.
| Original language | English |
|---|---|
| Pages (from-to) | 608-610 |
| Number of pages | 3 |
| Journal | Technical Physics Letters |
| Volume | 27 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - Jul 2001 |
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ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
Cite this
Belomyttsev, S. Y., & Ryzhov, V. V. (2001). The electron pinch lifetime in high-current rod pinch diodes. Technical Physics Letters, 27(7), 608-610. https://doi.org/10.1134/1.1388960