The effect of the regime of recording diffractograms on the profile and width of instrumental lines

S. I. Kuznetsov, A. S. Panin, E. Yu Tarasova

Research output: Contribution to journalArticle

Abstract

The influence of the operating mode of an X-ray diffractometer on the profile and integral width of instrumental lines was investigated. It was shown that the choice of a function for the best approximation of the instrumental line depends on an angular range of recording. The best approxi- mation functions in different angular ranges were determined. It was shown that the main effect on the instrumental line width is exerted by the dimensions of the input vertical divergence and receiving slits. The criterion of choice of the maximum size of the receiving slit for X-ray tubes with different sizes of the focal spots was experimentally substantiated.

Original languageEnglish
Pages (from-to)299-308
Number of pages10
JournalRussian Journal of Nondestructive Testing
Volume48
Issue number5
DOIs
Publication statusPublished - May 2012

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Keywords

  • Diffractogram
  • Instrumental line
  • Integral width
  • X-ray diffractometer

ASJC Scopus subject areas

  • Mechanical Engineering
  • Mechanics of Materials
  • Condensed Matter Physics
  • Materials Science(all)

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