The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids

Yury A. Khon, Petr P. Kaminskii, Evgeniya A. Moldovanova

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The paper studies the influence of electron transitions between energy levels in a stressed solid on the morphological instability of the surface. The instability development leads to the localization of inelastic deformation and nucleation of stress concentrators in the surface layer of solids.

Original languageEnglish
Title of host publicationAdvanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016
Subtitle of host publicationProceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016
PublisherAmerican Institute of Physics Inc.
Volume1783
ISBN (Electronic)9780735414457
DOIs
Publication statusPublished - 10 Nov 2016
EventInternational Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016 - Tomsk, Russian Federation
Duration: 19 Sep 201623 Sep 2016

Conference

ConferenceInternational Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016
CountryRussian Federation
CityTomsk
Period19.9.1623.9.16

Fingerprint

surface layers
electron transitions
concentrators
electronics
energy levels
nucleation

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Khon, Y. A., Kaminskii, P. P., & Moldovanova, E. A. (2016). The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. In Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016 (Vol. 1783). [020086] American Institute of Physics Inc.. https://doi.org/10.1063/1.4966379

The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. / Khon, Yury A.; Kaminskii, Petr P.; Moldovanova, Evgeniya A.

Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016. Vol. 1783 American Institute of Physics Inc., 2016. 020086.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Khon, YA, Kaminskii, PP & Moldovanova, EA 2016, The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. in Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016. vol. 1783, 020086, American Institute of Physics Inc., International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016, Tomsk, Russian Federation, 19.9.16. https://doi.org/10.1063/1.4966379
Khon YA, Kaminskii PP, Moldovanova EA. The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. In Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016. Vol. 1783. American Institute of Physics Inc. 2016. 020086 https://doi.org/10.1063/1.4966379
Khon, Yury A. ; Kaminskii, Petr P. ; Moldovanova, Evgeniya A. / The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016. Vol. 1783 American Institute of Physics Inc., 2016.
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