Abstract
The paper studies the influence of electron transitions between energy levels in a stressed solid on the morphological instability of the surface. The instability development leads to the localization of inelastic deformation and nucleation of stress concentrators in the surface layer of solids.
| Original language | English |
|---|---|
| Title of host publication | Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016 |
| Subtitle of host publication | Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016 |
| Publisher | American Institute of Physics Inc. |
| Volume | 1783 |
| ISBN (Electronic) | 9780735414457 |
| DOIs | |
| Publication status | Published - 10 Nov 2016 |
| Event | International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016 - Tomsk, Russian Federation Duration: 19 Sep 2016 → 23 Sep 2016 |
Conference
| Conference | International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016 |
|---|---|
| Country | Russian Federation |
| City | Tomsk |
| Period | 19.9.16 → 23.9.16 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
Cite this
The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. / Khon, Yury A.; Kaminskii, Petr P.; Moldovanova, Evgeniya A.
Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016. Vol. 1783 American Institute of Physics Inc., 2016. 020086.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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TY - GEN
T1 - The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids
AU - Khon, Yury A.
AU - Kaminskii, Petr P.
AU - Moldovanova, Evgeniya A.
PY - 2016/11/10
Y1 - 2016/11/10
N2 - The paper studies the influence of electron transitions between energy levels in a stressed solid on the morphological instability of the surface. The instability development leads to the localization of inelastic deformation and nucleation of stress concentrators in the surface layer of solids.
AB - The paper studies the influence of electron transitions between energy levels in a stressed solid on the morphological instability of the surface. The instability development leads to the localization of inelastic deformation and nucleation of stress concentrators in the surface layer of solids.
UR - http://www.scopus.com/inward/record.url?scp=85006059575&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85006059575&partnerID=8YFLogxK
U2 - 10.1063/1.4966379
DO - 10.1063/1.4966379
M3 - Conference contribution
VL - 1783
BT - Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016
PB - American Institute of Physics Inc.
ER -