The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids

Abstract

The paper studies the influence of electron transitions between energy levels in a stressed solid on the morphological instability of the surface. The instability development leads to the localization of inelastic deformation and nucleation of stress concentrators in the surface layer of solids.

Original language	English
Title of host publication	Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016
Subtitle of host publication	Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016
Publisher	American Institute of Physics Inc.
Volume	1783
ISBN (Electronic)	9780735414457
DOIs	https://doi.org/10.1063/1.4966379
Publication status	Published - 10 Nov 2016
Event	International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016 - Tomsk, Russian Federation Duration: 19 Sep 2016 → 23 Sep 2016

Conference

Conference	International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016
Country	Russian Federation
City	Tomsk
Period	19.9.16 → 23.9.16

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.4966379

Fingerprint Dive into the research topics of 'The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids'. Together they form a unique fingerprint.

Cite this

Khon, Y. A., Kaminskii, P. P., & Moldovanova, E. A. (2016). The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. In Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016 (Vol. 1783). [020086] American Institute of Physics Inc.. https://doi.org/10.1063/1.4966379

The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. / Khon, Yury A.; Kaminskii, Petr P.; Moldovanova, Evgeniya A.

Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016. Vol. 1783 American Institute of Physics Inc., 2016. 020086.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Khon, YA, Kaminskii, PP & Moldovanova, EA 2016, The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. in Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016. vol. 1783, 020086, American Institute of Physics Inc., International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016, Tomsk, Russian Federation, 19.9.16. https://doi.org/10.1063/1.4966379

Khon YA, Kaminskii PP, Moldovanova EA. The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. In Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016. Vol. 1783. American Institute of Physics Inc. 2016. 020086 https://doi.org/10.1063/1.4966379

Khon, Yury A. ; Kaminskii, Petr P. ; Moldovanova, Evgeniya A. / The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids. Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016. Vol. 1783 American Institute of Physics Inc., 2016.

@inproceedings{3d1cfad410fb4b14be737700e132ddaf,

title = "The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids",

abstract = "The paper studies the influence of electron transitions between energy levels in a stressed solid on the morphological instability of the surface. The instability development leads to the localization of inelastic deformation and nucleation of stress concentrators in the surface layer of solids.",

author = "Khon, {Yury A.} and Kaminskii, {Petr P.} and Moldovanova, {Evgeniya A.}",

year = "2016",

month = nov,

day = "10",

doi = "10.1063/1.4966379",

language = "English",

volume = "1783",

booktitle = "Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016",

publisher = "American Institute of Physics Inc.",

note = "International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016 ; Conference date: 19-09-2016 Through 23-09-2016",

}

TY - GEN

T1 - The effect of the electronic subsystem on the deformation and stress localization in the surface layer of solids

AU - Khon, Yury A.

AU - Kaminskii, Petr P.

AU - Moldovanova, Evgeniya A.

PY - 2016/11/10

Y1 - 2016/11/10

N2 - The paper studies the influence of electron transitions between energy levels in a stressed solid on the morphological instability of the surface. The instability development leads to the localization of inelastic deformation and nucleation of stress concentrators in the surface layer of solids.

AB - The paper studies the influence of electron transitions between energy levels in a stressed solid on the morphological instability of the surface. The instability development leads to the localization of inelastic deformation and nucleation of stress concentrators in the surface layer of solids.

UR - http://www.scopus.com/inward/record.url?scp=85006059575&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85006059575&partnerID=8YFLogxK

U2 - 10.1063/1.4966379

DO - 10.1063/1.4966379

M3 - Conference contribution

AN - SCOPUS:85006059575

VL - 1783

BT - Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016: Proceedings of the International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016

PB - American Institute of Physics Inc.

T2 - International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2016

Y2 - 19 September 2016 through 23 September 2016

ER -