Abstract
Raman spectroscopy is the tool of choice in the physicochemical investigation of carbon nanomaterials. However, Raman analysis of graphene oxide (GO) is lagging in comparison to the rich information gained in the case of carbon nanotubes and graphene. Here, we carried out a joint current sensing atomic force microscopy (CSAFM) and Raman spectroscopy investigation of laser-reduced GO. Reduced graphene oxide (rGO) was obtained under different laser powers in the range from 0.1 to 10 mW (532 nm). We compare the Raman spectra and the electrical conductivity at the nanoscale obtained by current sensing atomic force microscopy. Our analysis shows that three bands in the second-order region (2D, D + G, 2G), in the range from 2500 to 3200 cm -1 , are uniquely sensitive to the degree of reduction. Moreover, we found that the changes in peak area ratios A D+G /A D and A 2G /A D show a direct correlation with the electrical resistance of rGO. We establish an optical micro-spectroscopy way to assess the degree of reduction in laser-reduced GO. These new insights provide a convenient and useful way to investigate the reduction of rGO from the fitting analysis of Raman spectra, becoming a useful tool in fundamental research and the development of rGO-based microdevices.
| Original language | English |
|---|---|
| Pages (from-to) | 10125-10134 |
| Number of pages | 10 |
| Journal | Physical Chemistry Chemical Physics |
| Volume | 21 |
| Issue number | 19 |
| DOIs | |
| Publication status | Published - 1 Jan 2019 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry
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The correlation between electrical conductivity and second-order Raman modes of laser-reduced graphene oxide. / Ma, Bing; Rodriguez, Raul D.; Ruban, Alexey; Pavlov, Sergey; Sheremet, Evgeniya.
In: Physical Chemistry Chemical Physics, Vol. 21, No. 19, 01.01.2019, p. 10125-10134.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - The correlation between electrical conductivity and second-order Raman modes of laser-reduced graphene oxide
AU - Ma, Bing
AU - Rodriguez, Raul D.
AU - Ruban, Alexey
AU - Pavlov, Sergey
AU - Sheremet, Evgeniya
PY - 2019/1/1
Y1 - 2019/1/1
N2 - Raman spectroscopy is the tool of choice in the physicochemical investigation of carbon nanomaterials. However, Raman analysis of graphene oxide (GO) is lagging in comparison to the rich information gained in the case of carbon nanotubes and graphene. Here, we carried out a joint current sensing atomic force microscopy (CSAFM) and Raman spectroscopy investigation of laser-reduced GO. Reduced graphene oxide (rGO) was obtained under different laser powers in the range from 0.1 to 10 mW (532 nm). We compare the Raman spectra and the electrical conductivity at the nanoscale obtained by current sensing atomic force microscopy. Our analysis shows that three bands in the second-order region (2D, D + G, 2G), in the range from 2500 to 3200 cm -1 , are uniquely sensitive to the degree of reduction. Moreover, we found that the changes in peak area ratios A D+G /A D and A 2G /A D show a direct correlation with the electrical resistance of rGO. We establish an optical micro-spectroscopy way to assess the degree of reduction in laser-reduced GO. These new insights provide a convenient and useful way to investigate the reduction of rGO from the fitting analysis of Raman spectra, becoming a useful tool in fundamental research and the development of rGO-based microdevices.
AB - Raman spectroscopy is the tool of choice in the physicochemical investigation of carbon nanomaterials. However, Raman analysis of graphene oxide (GO) is lagging in comparison to the rich information gained in the case of carbon nanotubes and graphene. Here, we carried out a joint current sensing atomic force microscopy (CSAFM) and Raman spectroscopy investigation of laser-reduced GO. Reduced graphene oxide (rGO) was obtained under different laser powers in the range from 0.1 to 10 mW (532 nm). We compare the Raman spectra and the electrical conductivity at the nanoscale obtained by current sensing atomic force microscopy. Our analysis shows that three bands in the second-order region (2D, D + G, 2G), in the range from 2500 to 3200 cm -1 , are uniquely sensitive to the degree of reduction. Moreover, we found that the changes in peak area ratios A D+G /A D and A 2G /A D show a direct correlation with the electrical resistance of rGO. We establish an optical micro-spectroscopy way to assess the degree of reduction in laser-reduced GO. These new insights provide a convenient and useful way to investigate the reduction of rGO from the fitting analysis of Raman spectra, becoming a useful tool in fundamental research and the development of rGO-based microdevices.
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UR - http://www.scopus.com/inward/citedby.url?scp=85065982598&partnerID=8YFLogxK
U2 - 10.1039/c9cp00093c
DO - 10.1039/c9cp00093c
M3 - Article
AN - SCOPUS:85065982598
VL - 21
SP - 10125
EP - 10134
JO - Physical Chemistry Chemical Physics
JF - Physical Chemistry Chemical Physics
SN - 1463-9076
IS - 19
ER -