The correlation between electrical conductivity and second-order Raman modes of laser-reduced graphene oxide

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Abstract

Raman spectroscopy is the tool of choice in the physicochemical investigation of carbon nanomaterials. However, Raman analysis of graphene oxide (GO) is lagging in comparison to the rich information gained in the case of carbon nanotubes and graphene. Here, we carried out a joint current sensing atomic force microscopy (CSAFM) and Raman spectroscopy investigation of laser-reduced GO. Reduced graphene oxide (rGO) was obtained under different laser powers in the range from 0.1 to 10 mW (532 nm). We compare the Raman spectra and the electrical conductivity at the nanoscale obtained by current sensing atomic force microscopy. Our analysis shows that three bands in the second-order region (2D, D + G, 2G), in the range from 2500 to 3200 cm -1 , are uniquely sensitive to the degree of reduction. Moreover, we found that the changes in peak area ratios A D+G /A D and A 2G /A D show a direct correlation with the electrical resistance of rGO. We establish an optical micro-spectroscopy way to assess the degree of reduction in laser-reduced GO. These new insights provide a convenient and useful way to investigate the reduction of rGO from the fitting analysis of Raman spectra, becoming a useful tool in fundamental research and the development of rGO-based microdevices.

Original languageEnglish
Pages (from-to)10125-10134
Number of pages10
JournalPhysical Chemistry Chemical Physics
Volume21
Issue number19
DOIs
Publication statusPublished - 1 Jan 2019

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Laser modes
Oxides
graphene
electrical resistivity
oxides
Lasers
lasers
Raman spectroscopy
Raman scattering
Atomic force microscopy
atomic force microscopy
Raman spectra
Carbon Nanotubes
Acoustic impedance
Electric Conductivity
electrical resistance
Nanostructured materials
Carbon
carbon nanotubes

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

Cite this

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title = "The correlation between electrical conductivity and second-order Raman modes of laser-reduced graphene oxide",
abstract = "Raman spectroscopy is the tool of choice in the physicochemical investigation of carbon nanomaterials. However, Raman analysis of graphene oxide (GO) is lagging in comparison to the rich information gained in the case of carbon nanotubes and graphene. Here, we carried out a joint current sensing atomic force microscopy (CSAFM) and Raman spectroscopy investigation of laser-reduced GO. Reduced graphene oxide (rGO) was obtained under different laser powers in the range from 0.1 to 10 mW (532 nm). We compare the Raman spectra and the electrical conductivity at the nanoscale obtained by current sensing atomic force microscopy. Our analysis shows that three bands in the second-order region (2D, D + G, 2G), in the range from 2500 to 3200 cm -1 , are uniquely sensitive to the degree of reduction. Moreover, we found that the changes in peak area ratios A D+G /A D and A 2G /A D show a direct correlation with the electrical resistance of rGO. We establish an optical micro-spectroscopy way to assess the degree of reduction in laser-reduced GO. These new insights provide a convenient and useful way to investigate the reduction of rGO from the fitting analysis of Raman spectra, becoming a useful tool in fundamental research and the development of rGO-based microdevices.",
author = "Bing Ma and Rodriguez, {Raul D.} and Alexey Ruban and Sergey Pavlov and Evgeniya Sheremet",
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T1 - The correlation between electrical conductivity and second-order Raman modes of laser-reduced graphene oxide

AU - Ma, Bing

AU - Rodriguez, Raul D.

AU - Ruban, Alexey

AU - Pavlov, Sergey

AU - Sheremet, Evgeniya

PY - 2019/1/1

Y1 - 2019/1/1

N2 - Raman spectroscopy is the tool of choice in the physicochemical investigation of carbon nanomaterials. However, Raman analysis of graphene oxide (GO) is lagging in comparison to the rich information gained in the case of carbon nanotubes and graphene. Here, we carried out a joint current sensing atomic force microscopy (CSAFM) and Raman spectroscopy investigation of laser-reduced GO. Reduced graphene oxide (rGO) was obtained under different laser powers in the range from 0.1 to 10 mW (532 nm). We compare the Raman spectra and the electrical conductivity at the nanoscale obtained by current sensing atomic force microscopy. Our analysis shows that three bands in the second-order region (2D, D + G, 2G), in the range from 2500 to 3200 cm -1 , are uniquely sensitive to the degree of reduction. Moreover, we found that the changes in peak area ratios A D+G /A D and A 2G /A D show a direct correlation with the electrical resistance of rGO. We establish an optical micro-spectroscopy way to assess the degree of reduction in laser-reduced GO. These new insights provide a convenient and useful way to investigate the reduction of rGO from the fitting analysis of Raman spectra, becoming a useful tool in fundamental research and the development of rGO-based microdevices.

AB - Raman spectroscopy is the tool of choice in the physicochemical investigation of carbon nanomaterials. However, Raman analysis of graphene oxide (GO) is lagging in comparison to the rich information gained in the case of carbon nanotubes and graphene. Here, we carried out a joint current sensing atomic force microscopy (CSAFM) and Raman spectroscopy investigation of laser-reduced GO. Reduced graphene oxide (rGO) was obtained under different laser powers in the range from 0.1 to 10 mW (532 nm). We compare the Raman spectra and the electrical conductivity at the nanoscale obtained by current sensing atomic force microscopy. Our analysis shows that three bands in the second-order region (2D, D + G, 2G), in the range from 2500 to 3200 cm -1 , are uniquely sensitive to the degree of reduction. Moreover, we found that the changes in peak area ratios A D+G /A D and A 2G /A D show a direct correlation with the electrical resistance of rGO. We establish an optical micro-spectroscopy way to assess the degree of reduction in laser-reduced GO. These new insights provide a convenient and useful way to investigate the reduction of rGO from the fitting analysis of Raman spectra, becoming a useful tool in fundamental research and the development of rGO-based microdevices.

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