The conductivity of aluminum nitride ceramics

Abstract

Based on the analysis of the experimental behavior of the conductivity of highly dispersed aluminum nitride ceramics on temperature and frequency, conclusions are drawn about the existence in polycrystalline AIN of electromigration hopping mechanisms. At low temperatures and for high frequencies, the conductivity can be described within the framework of a two-point model, but as the temperature increases, or as the frequency decreases, a transition is observed through multiple jumps. The electromigration activation mechanisms dominate at temperatures higher than 370 K.

Original language	English
Pages (from-to)	686-688
Number of pages	3
Journal	Russian Physics Journal
Volume	35
Issue number	7
DOIs	https://doi.org/10.1007/BF00559244
Publication status	Published - Jul 1992

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1007/BF00559244

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Kabyshev, A. V., & Lopatin, V. V. (1992). The conductivity of aluminum nitride ceramics. Russian Physics Journal, 35(7), 686-688. https://doi.org/10.1007/BF00559244

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title = "The conductivity of aluminum nitride ceramics",

abstract = "Based on the analysis of the experimental behavior of the conductivity of highly dispersed aluminum nitride ceramics on temperature and frequency, conclusions are drawn about the existence in polycrystalline AIN of electromigration hopping mechanisms. At low temperatures and for high frequencies, the conductivity can be described within the framework of a two-point model, but as the temperature increases, or as the frequency decreases, a transition is observed through multiple jumps. The electromigration activation mechanisms dominate at temperatures higher than 370 K.",

author = "Kabyshev, {A. V.} and Lopatin, {V. V.}",

year = "1992",

month = jul,

doi = "10.1007/BF00559244",

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AB - Based on the analysis of the experimental behavior of the conductivity of highly dispersed aluminum nitride ceramics on temperature and frequency, conclusions are drawn about the existence in polycrystalline AIN of electromigration hopping mechanisms. At low temperatures and for high frequencies, the conductivity can be described within the framework of a two-point model, but as the temperature increases, or as the frequency decreases, a transition is observed through multiple jumps. The electromigration activation mechanisms dominate at temperatures higher than 370 K.

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