The characteristics of parametric x-rays from electrons near the x-edge in ge

Yu N. Adishchev, A. P. Potylitsin, V. A. Verzilov

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The characteristics of the parametric X-rays from 900 MeV electrons in Ge near the K absorption edge have been measured. The effect of absorption on radiation yield has been investigated.

Original languageEnglish
Pages (from-to)93-95
Number of pages3
JournalRadiation Effects and Defects in Solids
Volume125
Issue number1-3
DOIs
Publication statusPublished - 1 Jan 1993

Keywords

  • absorption in Ge
  • parametric X-ray emission

ASJC Scopus subject areas

  • Materials Science(all)
  • Nuclear and High Energy Physics
  • Radiation
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'The characteristics of parametric x-rays from electrons near the x-edge in ge'. Together they form a unique fingerprint.

  • Cite this