The breakdown study of three-layer solid dielectrics

D. P. Agoris, V. I. Chichikin, O. S. Gefle, S. M. Lebedev, I. Vitellas

Research Center for Technologies in Space Materials Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The influence of the lengthening of the path of the breakdown channel on the breakdown voltage of laminated dielectrics was studied. The path of the breakdown channel was elongated due to the increasing tangential component of electric field vectors at the interface. Results showed that the increase in breakdown strength at a permittivity of 0.25 in the three-layer samples was not related to the lengthening of the breakdown channel. The polarization process played a major role in the breakdown of inhomogeneous dielectrics.

Original language	English
Title of host publication	IEEE International Conference on Conduction and Breakdown in Solid Dielectrics
Pages	434-437
Number of pages	4
Publication status	Published - 2001
Event	7th International Conference on Solid Dielectrics - Eindhoven, Netherlands Duration: 25 Jun 2001 → 29 Jun 2001

Other

Other	7th International Conference on Solid Dielectrics
Country	Netherlands
City	Eindhoven
Period	25.6.01 → 29.6.01

ASJC Scopus subject areas

Electrical and Electronic Engineering

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title = "The breakdown study of three-layer solid dielectrics",

abstract = "The influence of the lengthening of the path of the breakdown channel on the breakdown voltage of laminated dielectrics was studied. The path of the breakdown channel was elongated due to the increasing tangential component of electric field vectors at the interface. Results showed that the increase in breakdown strength at a permittivity of 0.25 in the three-layer samples was not related to the lengthening of the breakdown channel. The polarization process played a major role in the breakdown of inhomogeneous dielectrics.",

author = "Agoris, {D. P.} and Chichikin, {V. I.} and Gefle, {O. S.} and Lebedev, {S. M.} and I. Vitellas",

year = "2001",

language = "English",

pages = "434--437",

booktitle = "IEEE International Conference on Conduction and Breakdown in Solid Dielectrics",

note = "7th International Conference on Solid Dielectrics ; Conference date: 25-06-2001 Through 29-06-2001",

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T1 - The breakdown study of three-layer solid dielectrics

AU - Agoris, D. P.

AU - Chichikin, V. I.

AU - Gefle, O. S.

AU - Lebedev, S. M.

AU - Vitellas, I.

PY - 2001

Y1 - 2001

N2 - The influence of the lengthening of the path of the breakdown channel on the breakdown voltage of laminated dielectrics was studied. The path of the breakdown channel was elongated due to the increasing tangential component of electric field vectors at the interface. Results showed that the increase in breakdown strength at a permittivity of 0.25 in the three-layer samples was not related to the lengthening of the breakdown channel. The polarization process played a major role in the breakdown of inhomogeneous dielectrics.

AB - The influence of the lengthening of the path of the breakdown channel on the breakdown voltage of laminated dielectrics was studied. The path of the breakdown channel was elongated due to the increasing tangential component of electric field vectors at the interface. Results showed that the increase in breakdown strength at a permittivity of 0.25 in the three-layer samples was not related to the lengthening of the breakdown channel. The polarization process played a major role in the breakdown of inhomogeneous dielectrics.

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M3 - Conference contribution

AN - SCOPUS:0035193347

SP - 434

EP - 437

BT - IEEE International Conference on Conduction and Breakdown in Solid Dielectrics

T2 - 7th International Conference on Solid Dielectrics

Y2 - 25 June 2001 through 29 June 2001

ER -