The breakdown study of three-layer solid dielectrics

D. P. Agoris, V. I. Chichikin, O. S. Gefle, S. M. Lebedev, I. Vitellas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

The influence of the lengthening of the path of the breakdown channel on the breakdown voltage of laminated dielectrics was studied. The path of the breakdown channel was elongated due to the increasing tangential component of electric field vectors at the interface. Results showed that the increase in breakdown strength at a permittivity of 0.25 in the three-layer samples was not related to the lengthening of the breakdown channel. The polarization process played a major role in the breakdown of inhomogeneous dielectrics.

Original languageEnglish
Title of host publicationIEEE International Conference on Conduction and Breakdown in Solid Dielectrics
Pages434-437
Number of pages4
Publication statusPublished - 2001
Event7th International Conference on Solid Dielectrics - Eindhoven, Netherlands
Duration: 25 Jun 200129 Jun 2001

Other

Other7th International Conference on Solid Dielectrics
CountryNetherlands
CityEindhoven
Period25.6.0129.6.01

Fingerprint

Electric breakdown
Permittivity
Electric fields
Polarization

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Agoris, D. P., Chichikin, V. I., Gefle, O. S., Lebedev, S. M., & Vitellas, I. (2001). The breakdown study of three-layer solid dielectrics. In IEEE International Conference on Conduction and Breakdown in Solid Dielectrics (pp. 434-437)

The breakdown study of three-layer solid dielectrics. / Agoris, D. P.; Chichikin, V. I.; Gefle, O. S.; Lebedev, S. M.; Vitellas, I.

IEEE International Conference on Conduction and Breakdown in Solid Dielectrics. 2001. p. 434-437.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Agoris, DP, Chichikin, VI, Gefle, OS, Lebedev, SM & Vitellas, I 2001, The breakdown study of three-layer solid dielectrics. in IEEE International Conference on Conduction and Breakdown in Solid Dielectrics. pp. 434-437, 7th International Conference on Solid Dielectrics, Eindhoven, Netherlands, 25.6.01.
Agoris DP, Chichikin VI, Gefle OS, Lebedev SM, Vitellas I. The breakdown study of three-layer solid dielectrics. In IEEE International Conference on Conduction and Breakdown in Solid Dielectrics. 2001. p. 434-437
Agoris, D. P. ; Chichikin, V. I. ; Gefle, O. S. ; Lebedev, S. M. ; Vitellas, I. / The breakdown study of three-layer solid dielectrics. IEEE International Conference on Conduction and Breakdown in Solid Dielectrics. 2001. pp. 434-437
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