The bit error rate for complex SSC/MRC combiner in the presence of Rayleigh fading

Dragana Krstić, Petar Nikolić, Stefan Panić, Vesad Doljak

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, the complex Switch and Stay Combining/Maximal Ratio Combining (SSC/MRC) combiner is considered. The system output signal in the presence of Rayleigh fading, at two time instants at the input is observed. Both, SSC and MRC combiners are dual-branches. The probability density function (PDF) at the output of the complex combiner is obtained. Then, the bit error rate (BER) for the special case of binary phase swift keying (BPSK) modulation is determined. The obtained results are shown graphically to point out the improvement because of using the complex SSC/MRC combiner with regard to classical SSC and MRC combiners at one time instant.

Original languageEnglish
Title of host publicationProceedings of the International Conference on Information and Communication Systems, ICICS '12
DOIs
Publication statusPublished - 28 Jun 2012
Externally publishedYes
Event3rd International Conference on Information and Communication Systems, ICICS '12 - Irbid, Jordan
Duration: 3 Apr 20125 Apr 2012

Publication series

NameACM International Conference Proceeding Series

Conference

Conference3rd International Conference on Information and Communication Systems, ICICS '12
CountryJordan
CityIrbid
Period3.4.125.4.12

    Fingerprint

Keywords

  • bit error rate
  • complex SSC/MRC combiner
  • probability density function
  • Rayleigh fading
  • two time instants

ASJC Scopus subject areas

  • Software
  • Human-Computer Interaction
  • Computer Vision and Pattern Recognition
  • Computer Networks and Communications

Cite this

Krstić, D., Nikolić, P., Panić, S., & Doljak, V. (2012). The bit error rate for complex SSC/MRC combiner in the presence of Rayleigh fading. In Proceedings of the International Conference on Information and Communication Systems, ICICS '12 (ACM International Conference Proceeding Series). https://doi.org/10.1145/2222444.2222458