Abstract
The temperature dependence of the dielectric strength Epn of ZnS:Mn films produced by high-frequency magnetron sputtering was investigated in the range T = 20-200°C. It is shown that processes associated with removal of adsorbed water from the ZnS:Mn films are responsible for the maximum on the Epn = f(T) curve. Data on the temperature dependence of the capacitance and loss-angle tangent are given for thin-film systems based on ZnS:Mn.
Original language | English |
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Pages (from-to) | 576-578 |
Number of pages | 3 |
Journal | Russian Physics Journal |
Volume | 39 |
Issue number | 6 |
Publication status | Published - 1996 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy(all)