The temperature dependence of the dielectric strength Epn of ZnS:Mn films produced by high-frequency magnetron sputtering was investigated in the range T = 20-200°C. It is shown that processes associated with removal of adsorbed water from the ZnS:Mn films are responsible for the maximum on the Epn = f(T) curve. Data on the temperature dependence of the capacitance and loss-angle tangent are given for thin-film systems based on ZnS:Mn.
|Number of pages||3|
|Journal||Russian Physics Journal|
|Publication status||Published - 1996|
ASJC Scopus subject areas
- Physics and Astronomy(all)