Tailoring the electric and magnetic properties of submicron-sized metallic multilayered systems by TVA atomic inter-diffusion engineered processes

F. Miculescu, I. Jepu, G. E. Stan, M. Miculescu, S. I. Voicu, C. Cotrut, T. Machedon Pisu, S. Ciuca

Research output: Contribution to journalArticle

Abstract

Thermo-ionic Vacuum Arc evaporation method was selected for the synthesis of Fe/Cu/Ni/Cu multilayer structures on Si (1 0 0) substrates. The aim of the study was the preparation and characterization of structures featuring a giant magnetoresistance effect. This was accomplished by inducing the formation of nanosized ferromagnetic crystallites in multilayer nonmagnetic solutions via atomic inter-diffusion processes by the tuning of deposition parameters. Layer-by-layer and inter-diffused type structures were prepared and comparatively analyzed by scanning electron microscopy, X-ray microanalysis, atomic force microscopy, X-ray diffraction and high-resolution transmission electron microscopy coupled with selected area electron diffraction. We presented the influence of the microstructure on electric and magnetic properties of the submicron-sized multilayers. The dependence of the electric resistance and the magnetoresistance on the composition, structure, morphology and roughness of the layers was established. We obtained an electric resistance value of 1.22 Ω for the layer-by-layer type structure, and 0.46 Ω for the inter-diffusion designed structure. Using the atomic inter-diffusion we succeeded in achieving an improvement of the magnetoresistive effect, from 0.1% to 2.3%.

Original languageEnglish
Pages (from-to)619-626
Number of pages8
JournalApplied Surface Science
Volume358
DOIs
Publication statusPublished - 15 Dec 2015
Externally publishedYes

Fingerprint

Magnetic properties
Multilayers
Electric properties
magnetic properties
Giant magnetoresistance
Microanalysis
Magnetoresistance
High resolution transmission electron microscopy
Crystallites
Electron diffraction
Atomic force microscopy
Evaporation
Tuning
Surface roughness
Vacuum
X ray diffraction
X rays
Microstructure
Scanning electron microscopy
microanalysis

Keywords

  • Composition
  • Engineered atomic inter-diffusion
  • GMR effect
  • Structure
  • Sub-micrometric magnetic layers

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

Cite this

Tailoring the electric and magnetic properties of submicron-sized metallic multilayered systems by TVA atomic inter-diffusion engineered processes. / Miculescu, F.; Jepu, I.; Stan, G. E.; Miculescu, M.; Voicu, S. I.; Cotrut, C.; Pisu, T. Machedon; Ciuca, S.

In: Applied Surface Science, Vol. 358, 15.12.2015, p. 619-626.

Research output: Contribution to journalArticle

Miculescu, F. ; Jepu, I. ; Stan, G. E. ; Miculescu, M. ; Voicu, S. I. ; Cotrut, C. ; Pisu, T. Machedon ; Ciuca, S. / Tailoring the electric and magnetic properties of submicron-sized metallic multilayered systems by TVA atomic inter-diffusion engineered processes. In: Applied Surface Science. 2015 ; Vol. 358. pp. 619-626.
@article{e6d3c354e7b948c19bb6769fa105f888,
title = "Tailoring the electric and magnetic properties of submicron-sized metallic multilayered systems by TVA atomic inter-diffusion engineered processes",
abstract = "Thermo-ionic Vacuum Arc evaporation method was selected for the synthesis of Fe/Cu/Ni/Cu multilayer structures on Si (1 0 0) substrates. The aim of the study was the preparation and characterization of structures featuring a giant magnetoresistance effect. This was accomplished by inducing the formation of nanosized ferromagnetic crystallites in multilayer nonmagnetic solutions via atomic inter-diffusion processes by the tuning of deposition parameters. Layer-by-layer and inter-diffused type structures were prepared and comparatively analyzed by scanning electron microscopy, X-ray microanalysis, atomic force microscopy, X-ray diffraction and high-resolution transmission electron microscopy coupled with selected area electron diffraction. We presented the influence of the microstructure on electric and magnetic properties of the submicron-sized multilayers. The dependence of the electric resistance and the magnetoresistance on the composition, structure, morphology and roughness of the layers was established. We obtained an electric resistance value of 1.22 Ω for the layer-by-layer type structure, and 0.46 Ω for the inter-diffusion designed structure. Using the atomic inter-diffusion we succeeded in achieving an improvement of the magnetoresistive effect, from 0.1{\%} to 2.3{\%}.",
keywords = "Composition, Engineered atomic inter-diffusion, GMR effect, Structure, Sub-micrometric magnetic layers",
author = "F. Miculescu and I. Jepu and Stan, {G. E.} and M. Miculescu and Voicu, {S. I.} and C. Cotrut and Pisu, {T. Machedon} and S. Ciuca",
year = "2015",
month = "12",
day = "15",
doi = "10.1016/j.apsusc.2015.08.247",
language = "English",
volume = "358",
pages = "619--626",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",

}

TY - JOUR

T1 - Tailoring the electric and magnetic properties of submicron-sized metallic multilayered systems by TVA atomic inter-diffusion engineered processes

AU - Miculescu, F.

AU - Jepu, I.

AU - Stan, G. E.

AU - Miculescu, M.

AU - Voicu, S. I.

AU - Cotrut, C.

AU - Pisu, T. Machedon

AU - Ciuca, S.

PY - 2015/12/15

Y1 - 2015/12/15

N2 - Thermo-ionic Vacuum Arc evaporation method was selected for the synthesis of Fe/Cu/Ni/Cu multilayer structures on Si (1 0 0) substrates. The aim of the study was the preparation and characterization of structures featuring a giant magnetoresistance effect. This was accomplished by inducing the formation of nanosized ferromagnetic crystallites in multilayer nonmagnetic solutions via atomic inter-diffusion processes by the tuning of deposition parameters. Layer-by-layer and inter-diffused type structures were prepared and comparatively analyzed by scanning electron microscopy, X-ray microanalysis, atomic force microscopy, X-ray diffraction and high-resolution transmission electron microscopy coupled with selected area electron diffraction. We presented the influence of the microstructure on electric and magnetic properties of the submicron-sized multilayers. The dependence of the electric resistance and the magnetoresistance on the composition, structure, morphology and roughness of the layers was established. We obtained an electric resistance value of 1.22 Ω for the layer-by-layer type structure, and 0.46 Ω for the inter-diffusion designed structure. Using the atomic inter-diffusion we succeeded in achieving an improvement of the magnetoresistive effect, from 0.1% to 2.3%.

AB - Thermo-ionic Vacuum Arc evaporation method was selected for the synthesis of Fe/Cu/Ni/Cu multilayer structures on Si (1 0 0) substrates. The aim of the study was the preparation and characterization of structures featuring a giant magnetoresistance effect. This was accomplished by inducing the formation of nanosized ferromagnetic crystallites in multilayer nonmagnetic solutions via atomic inter-diffusion processes by the tuning of deposition parameters. Layer-by-layer and inter-diffused type structures were prepared and comparatively analyzed by scanning electron microscopy, X-ray microanalysis, atomic force microscopy, X-ray diffraction and high-resolution transmission electron microscopy coupled with selected area electron diffraction. We presented the influence of the microstructure on electric and magnetic properties of the submicron-sized multilayers. The dependence of the electric resistance and the magnetoresistance on the composition, structure, morphology and roughness of the layers was established. We obtained an electric resistance value of 1.22 Ω for the layer-by-layer type structure, and 0.46 Ω for the inter-diffusion designed structure. Using the atomic inter-diffusion we succeeded in achieving an improvement of the magnetoresistive effect, from 0.1% to 2.3%.

KW - Composition

KW - Engineered atomic inter-diffusion

KW - GMR effect

KW - Structure

KW - Sub-micrometric magnetic layers

UR - http://www.scopus.com/inward/record.url?scp=84940998559&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84940998559&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2015.08.247

DO - 10.1016/j.apsusc.2015.08.247

M3 - Article

VL - 358

SP - 619

EP - 626

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

ER -