System of digital radiography for nondestructive testing in the radiation energy range of 1-20 MeV

Ju A. Moskalyov, A. C. Temnik, S. V. Chakhlov, A. S. Chekalin, A. A. Dmitrov, Hongnian Lu, Hanchang Zhou, Yan Han, Deheng Pan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A study was conducted on systems of digital radiography (SDR) for X-radiation in the energy range of 1-20 MeV. Calculations were carried out to determine the conversion efficiency of screens having various compositions. Focus was on the dependence of the fraction of X-ray quantum energy deposited in a luminescent screen versus incident quantum energy. All calculations were made for the phosphor screen thickness of 500 μm and CsI·Tl single crystal screen thickness of 5 mm. The results show that the usage of an SDR with a 5-mm-thick single crystal CsI·Tl screen allows the detection of a 0.2-mm-deep groove of a groove standard #2.

Original languageEnglish
Title of host publicationProceedings of the International Symposium on Test and Measurement
PublisherInt Acad Publ
Pages794-797
Number of pages4
ISBN (Print)7800034410
Publication statusPublished - 1999
EventProceedings of the 1999 3rd International Symposium on Test and Measurement, ISTM-99 - Xi'an, China
Duration: 2 Jun 19994 Jun 1999

Publication series

NameProceedings of the International Symposium on Test and Measurement

Conference

ConferenceProceedings of the 1999 3rd International Symposium on Test and Measurement, ISTM-99
CityXi'an, China
Period2.6.994.6.99

ASJC Scopus subject areas

  • Engineering(all)

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    Moskalyov, J. A., Temnik, A. C., Chakhlov, S. V., Chekalin, A. S., Dmitrov, A. A., Lu, H., Zhou, H., Han, Y., & Pan, D. (1999). System of digital radiography for nondestructive testing in the radiation energy range of 1-20 MeV. In Proceedings of the International Symposium on Test and Measurement (pp. 794-797). (Proceedings of the International Symposium on Test and Measurement). Int Acad Publ.