Abstract
A study was conducted on systems of digital radiography (SDR) for X-radiation in the energy range of 1-20 MeV. Calculations were carried out to determine the conversion efficiency of screens having various compositions. Focus was on the dependence of the fraction of X-ray quantum energy deposited in a luminescent screen versus incident quantum energy. All calculations were made for the phosphor screen thickness of 500 μm and CsI·Tl single crystal screen thickness of 5 mm. The results show that the usage of an SDR with a 5-mm-thick single crystal CsI·Tl screen allows the detection of a 0.2-mm-deep groove of a groove standard #2.
| Original language | English |
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| Title of host publication | Proceedings of the International Symposium on Test and Measurement |
| Publisher | Int Acad Publ |
| Pages | 794-797 |
| Number of pages | 4 |
| ISBN (Print) | 7800034410 |
| Publication status | Published - 1999 |
| Event | Proceedings of the 1999 3rd International Symposium on Test and Measurement, ISTM-99 - Xi'an, China Duration: 2 Jun 1999 → 4 Jun 1999 |
Publication series
| Name | Proceedings of the International Symposium on Test and Measurement |
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Conference
| Conference | Proceedings of the 1999 3rd International Symposium on Test and Measurement, ISTM-99 |
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| City | Xi'an, China |
| Period | 2.6.99 → 4.6.99 |
ASJC Scopus subject areas
- Engineering(all)
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Moskalyov, J. A., Temnik, A. C., Chakhlov, S. V., Chekalin, A. S., Dmitrov, A. A., Lu, H., Zhou, H., Han, Y., & Pan, D. (1999). System of digital radiography for nondestructive testing in the radiation energy range of 1-20 MeV. In Proceedings of the International Symposium on Test and Measurement (pp. 794-797). (Proceedings of the International Symposium on Test and Measurement). Int Acad Publ.