TY - GEN
T1 - Surface modification of tini dental implants by ion- and electron beam influence
AU - Meisner, L. L.
AU - Sivokha, V. P.
AU - Lotkov, A. I.
AU - Gritsenko, B. P.
AU - Rotshtein, V. P.
AU - Karlick, K. V.
AU - Razdorskii, V. V.
AU - Kotenko, M. V.
N1 - Copyright:
Copyright 2009 Elsevier B.V., All rights reserved.
PY - 2008
Y1 - 2008
N2 - The paper reports experimental results on elemental and structural phase compositions of thin surface layers and physical-mechanical behavior of the TiNi dental implants processed by the high-dose ion (Ti, Zr, Pd, Si, etc.) implantation (HDII) and the pulsed electron beam melting. The types of implanted ions and irradiation doses were varied from 0.7-1016 cm-2 till 5.6-1017 cm2. The energy of all ions equals 60 keV. The low- energy (̃30keV) high current (̃30 kA) electron beam (3-10 J/cm2, LEHCEB) pulsed with 2-3 μs in time length have been used. Surface characterization of the implants was performed with the assistance of Auger electron spectroscopy, X-ray diffraction and grazing incidence analysis. HDII treatment of the implant surfaces is accompanied by deep surface oxidation. The thickness of the layer containing Si-ions is almost twice as large as the thickness of Ti49.5Ni50.5 layers that contain metal implanted ions (Ti, Zr, Pd). Nickel is missing in the surface layer down to a depth of ̃3O-40 nm in the ion-modified samples. LEHCEBs influence of the TiNi implants does not change the Ni, Ti and 0 concentration-depth profiles, but microhardness of the surface layer (̃300 nm depth) modified by LEHCEB is fifth as higher as of the initial state. All TiNi implants treated by HDII and LEHCEBs have higher corrosion stability than the electropolished implants.
AB - The paper reports experimental results on elemental and structural phase compositions of thin surface layers and physical-mechanical behavior of the TiNi dental implants processed by the high-dose ion (Ti, Zr, Pd, Si, etc.) implantation (HDII) and the pulsed electron beam melting. The types of implanted ions and irradiation doses were varied from 0.7-1016 cm-2 till 5.6-1017 cm2. The energy of all ions equals 60 keV. The low- energy (̃30keV) high current (̃30 kA) electron beam (3-10 J/cm2, LEHCEB) pulsed with 2-3 μs in time length have been used. Surface characterization of the implants was performed with the assistance of Auger electron spectroscopy, X-ray diffraction and grazing incidence analysis. HDII treatment of the implant surfaces is accompanied by deep surface oxidation. The thickness of the layer containing Si-ions is almost twice as large as the thickness of Ti49.5Ni50.5 layers that contain metal implanted ions (Ti, Zr, Pd). Nickel is missing in the surface layer down to a depth of ̃3O-40 nm in the ion-modified samples. LEHCEBs influence of the TiNi implants does not change the Ni, Ti and 0 concentration-depth profiles, but microhardness of the surface layer (̃300 nm depth) modified by LEHCEB is fifth as higher as of the initial state. All TiNi implants treated by HDII and LEHCEBs have higher corrosion stability than the electropolished implants.
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U2 - 10.1361/cp2006smst235
DO - 10.1361/cp2006smst235
M3 - Conference contribution
AN - SCOPUS:63149095537
SN - 9780871708625
T3 - SMST-2006 - Proceedings of the International Conference on Shape Memory and Superelastic Technologies
SP - 235
EP - 242
BT - SMST-2006 - Proceedings of the International Conference on Shape Memory and Superelastic Technologies
T2 - International Conference on Shape Memory and Superelastic Technologies, SMST-2006
Y2 - 7 May 2006 through 11 May 2006
ER -