Super-Enhancement Focusing of Teflon Spheres

Abstract

A Teflon (polytetrafluoroethylene) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low-loss property in the terahertz band. Herein, field intensities and focusing parameters are analytically calculated for Teflon spheres at different low-loss levels and then a super-enhancement focusing effect in the spheres with particular size parameters was discovered, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proves that the strong scattering of a single-order mode in the internal electric or magnetic field is the main factor causing this phenomenon.

Original language	English
Article number	2000373
Journal	Annalen der Physik
Volume	532
Issue number	10
DOIs	https://doi.org/10.1002/andp.202000373
Publication status	Published - 1 Oct 2020

Keywords

dielectric particles
low-loss materials
Mie theory
near-field focusing
Teflon spheres

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1002/andp.202000373

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Cite this

Yue, L., Wang, Z., Yan, B., Monks, J. N., Joya, Y., Dhama, R., Minin, O. V., & Minin, I. V. (2020). Super-Enhancement Focusing of Teflon Spheres. Annalen der Physik, 532(10), [2000373]. https://doi.org/10.1002/andp.202000373

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title = "Super-Enhancement Focusing of Teflon Spheres",

abstract = "A Teflon (polytetrafluoroethylene) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low-loss property in the terahertz band. Herein, field intensities and focusing parameters are analytically calculated for Teflon spheres at different low-loss levels and then a super-enhancement focusing effect in the spheres with particular size parameters was discovered, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proves that the strong scattering of a single-order mode in the internal electric or magnetic field is the main factor causing this phenomenon.",

keywords = "dielectric particles, low-loss materials, Mie theory, near-field focusing, Teflon spheres",

author = "Liyang Yue and Zengbo Wang and Bing Yan and Monks, {James N.} and Yasir Joya and Rakesh Dhama and Minin, {Oleg V.} and Minin, {Igor V.}",

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AU - Yue, Liyang

AU - Wang, Zengbo

AU - Yan, Bing

AU - Monks, James N.

AU - Joya, Yasir

AU - Dhama, Rakesh

AU - Minin, Oleg V.

AU - Minin, Igor V.

PY - 2020/10/1

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KW - low-loss materials

KW - Mie theory

KW - near-field focusing

KW - Teflon spheres

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