Abstract
The attempt to classify and discuss the terminology used in thermal/infrared nondestructive testing is made. The table of related terms with definitions and references is available.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Editors | Douglas D. Burleigh, Jane W. Spicer |
| Pages | 276-281 |
| Number of pages | 6 |
| Volume | 2766 |
| Publication status | Published - 1996 |
| Event | Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications - Orlando, FL, USA Duration: 10 Apr 1996 → 12 Apr 1996 |
Other
| Other | Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications |
|---|---|
| City | Orlando, FL, USA |
| Period | 10.4.96 → 12.4.96 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
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Cite this
Vavilov, V. P. (1996). Subjective remarks on the terminology used in thermal/infrared nondestructive testing. In D. D. Burleigh, & J. W. Spicer (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2766, pp. 276-281)