Subjective remarks on the terminology used in thermal/infrared nondestructive testing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

The attempt to classify and discuss the terminology used in thermal/infrared nondestructive testing is made. The table of related terms with definitions and references is available.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsDouglas D. Burleigh, Jane W. Spicer
Pages276-281
Number of pages6
Volume2766
Publication statusPublished - 1996
EventThermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications - Orlando, FL, USA
Duration: 10 Apr 199612 Apr 1996

Other

OtherThermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
CityOrlando, FL, USA
Period10.4.9612.4.96

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Vavilov, V. P. (1996). Subjective remarks on the terminology used in thermal/infrared nondestructive testing. In D. D. Burleigh, & J. W. Spicer (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2766, pp. 276-281)