Subjective remarks on the terminology used in thermal/infrared nondestructive testing

Center for Industrial Tomography

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The attempt to classify and discuss the terminology used in thermal/infrared nondestructive testing is made. The table of related terms with definitions and references is available.

Original language	English
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Editors	Douglas D. Burleigh, Jane W. Spicer
Pages	276-281
Number of pages	6
Volume	2766
Publication status	Published - 1996
Event	Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications - Orlando, FL, USA Duration: 10 Apr 1996 → 12 Apr 1996

Other

Other	Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
City	Orlando, FL, USA
Period	10.4.96 → 12.4.96

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics

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Cite this

@inproceedings{eb61c4a4dd024091a5d55a26b01c4f1f,

title = "Subjective remarks on the terminology used in thermal/infrared nondestructive testing",

abstract = "The attempt to classify and discuss the terminology used in thermal/infrared nondestructive testing is made. The table of related terms with definitions and references is available.",

author = "Vavilov, {Vladimir P.}",

year = "1996",

language = "English",

isbn = "0819421472",

volume = "2766",

pages = "276--281",

editor = "Burleigh, {Douglas D.} and Spicer, {Jane W.}",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

note = "Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications ; Conference date: 10-04-1996 Through 12-04-1996",

}

TY - GEN

T1 - Subjective remarks on the terminology used in thermal/infrared nondestructive testing

AU - Vavilov, Vladimir P.

PY - 1996

Y1 - 1996

N2 - The attempt to classify and discuss the terminology used in thermal/infrared nondestructive testing is made. The table of related terms with definitions and references is available.

AB - The attempt to classify and discuss the terminology used in thermal/infrared nondestructive testing is made. The table of related terms with definitions and references is available.

UR - http://www.scopus.com/inward/record.url?scp=0029713683&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029713683&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0029713683

SN - 0819421472

SN - 9780819421470

VL - 2766

SP - 276

EP - 281

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Burleigh, Douglas D.

A2 - Spicer, Jane W.

T2 - Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications

Y2 - 10 April 1996 through 12 April 1996

ER -