Sub-micrometer resolution transverse electron beam size measurement system based on Optical Transition Radiation

A. Aryshev, N. Terunuma, J. Urakawa, S. T. Boogert, P. Karataev, D. Howell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Fingerprint Dive into the research topics of 'Sub-micrometer resolution transverse electron beam size measurement system based on Optical Transition Radiation'. Together they form a unique fingerprint.

Physics & Astronomy