Sub-micrometer resolution transverse electron beam size measurement system based on Optical Transition Radiation

A. Aryshev, N. Terunuma, J. Urakawa, S. T. Boogert, P. Karataev, D. Howell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by so-called Point Spread Function (PSF) dimension - the source distribution generated by a single electron and projected by an optical system onto a screen. In our experiment we managed to create a system which can practically measure the PSF distribution. We demonstrated that it is non-uniform. In this paper we represent the development of a novel sub-micrometer electron beam profile monitor based on the measurements of the PSF structure which visibility is sensitive to micrometer electron beam dimensions. In this report the recent experimental results and the future plans on the optimization of the monitor are presented.

Original languageEnglish
Title of host publicationIPAC 2010 - 1st International Particle Accelerator Conference
Pages193-195
Number of pages3
Publication statusPublished - 2010
Externally publishedYes
Event1st International Particle Accelerator Conference, IPAC 2010 - Kyoto, Japan
Duration: 23 May 201028 May 2010

Conference

Conference1st International Particle Accelerator Conference, IPAC 2010
CountryJapan
CityKyoto
Period23.5.1028.5.10

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ASJC Scopus subject areas

  • Nuclear and High Energy Physics

Cite this

Aryshev, A., Terunuma, N., Urakawa, J., Boogert, S. T., Karataev, P., & Howell, D. (2010). Sub-micrometer resolution transverse electron beam size measurement system based on Optical Transition Radiation. In IPAC 2010 - 1st International Particle Accelerator Conference (pp. 193-195)