Sub-micrometer resolution transverse electron beam size measurement system based on optical transition radiation

A. Aryshev, N. Terunuma, J. Urakawa, S. T. Boogert, P. Karataev, D. Howell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Optical Transition Radiation (OTR) appears when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by the Point Spread Function (PSF) dimension - The source distribution generated by a single electron and projected by an optical system onto a screen. For small electron beam dimensions, the PSF form significantly depends on various parameters of the optical system like diffraction of the OTR tails, spherical and chromatic aberrations, etc. In our experiment we managed to create a system which can practically measure the PSF distribution and using a new self-calibration method we are able to calculate transverse electron beam size. Here we represent the development, data analysis and novel calibration technique of a sub-micrometer electron beam profile monitor based on the measurements of the PSF shape, which visibility is sensitive to sub-micrometer electron beam dimensions.

Original languageEnglish
Title of host publicationIPAC 2011 - 2nd International Particle Accelerator Conference
Pages1964-1966
Number of pages3
Publication statusPublished - 2011
Externally publishedYes
Event2nd International Particle Accelerator Conference, IPAC 2011 - Kursaal, San Sebastian, Spain
Duration: 4 Sep 20119 Sep 2011

Conference

Conference2nd International Particle Accelerator Conference, IPAC 2011
CountrySpain
CityKursaal, San Sebastian
Period4.9.119.9.11

Fingerprint

point spread functions
optical transition
micrometers
electron beams
radiation
monitors
charged particles
particle beams
profiles
visibility
dielectric properties
aberration
diffraction
electrons

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

Cite this

Aryshev, A., Terunuma, N., Urakawa, J., Boogert, S. T., Karataev, P., & Howell, D. (2011). Sub-micrometer resolution transverse electron beam size measurement system based on optical transition radiation. In IPAC 2011 - 2nd International Particle Accelerator Conference (pp. 1964-1966)

Sub-micrometer resolution transverse electron beam size measurement system based on optical transition radiation. / Aryshev, A.; Terunuma, N.; Urakawa, J.; Boogert, S. T.; Karataev, P.; Howell, D.

IPAC 2011 - 2nd International Particle Accelerator Conference. 2011. p. 1964-1966.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Aryshev, A, Terunuma, N, Urakawa, J, Boogert, ST, Karataev, P & Howell, D 2011, Sub-micrometer resolution transverse electron beam size measurement system based on optical transition radiation. in IPAC 2011 - 2nd International Particle Accelerator Conference. pp. 1964-1966, 2nd International Particle Accelerator Conference, IPAC 2011, Kursaal, San Sebastian, Spain, 4.9.11.
Aryshev A, Terunuma N, Urakawa J, Boogert ST, Karataev P, Howell D. Sub-micrometer resolution transverse electron beam size measurement system based on optical transition radiation. In IPAC 2011 - 2nd International Particle Accelerator Conference. 2011. p. 1964-1966
Aryshev, A. ; Terunuma, N. ; Urakawa, J. ; Boogert, S. T. ; Karataev, P. ; Howell, D. / Sub-micrometer resolution transverse electron beam size measurement system based on optical transition radiation. IPAC 2011 - 2nd International Particle Accelerator Conference. 2011. pp. 1964-1966
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