Study of the Materials Microstructure using Topological Properties of Complex Networks

Mikhail Semenov, Kira Lelushkina

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Abstract

A method for mapping a two-dimensional color image of the microstructure of the material to a complex network is proposed. Each image elements is assigned to node network. A weighted combination of distance metrics - the Euclidean distance and the Manhattan distance - defines whether there is or not an edge between corresponding nodes. The first metric is used to calculate the spatial distance between the picture elements (pixels), the second metric takes into account the contrast between the brightness of pixels in the gray scale. On the basis of the topological properties of the constructed network the edge pixels were detected that allows us to identify the border areas in the microstructure of materials. The proposed method can be used in automated systems of materialographic analysis.

Original languageEnglish
Article number012040
JournalIOP Conference Series: Materials Science and Engineering
Volume135
Issue number1
DOIs
Publication statusPublished - 2 Aug 2016
Event8th International Scientific Conference on Issues of Physics and Technology in Science, Industry and Medicine - Tomsk, Russian Federation
Duration: 1 Jun 20163 Jun 2016

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

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