TY - JOUR
T1 - Study of the effect of low-frequency interference on resistance-to-voltage converter in cable insulation testing
AU - Yermoshin, Nikolay I.
AU - Yakimov, Evgeny V.
AU - Goldshtein, Aleksandr E.
N1 - Publisher Copyright:
© 2019 Trans Tech Publications Ltd, Switzerland.
Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2019
Y1 - 2019
N2 - The study focuses on the effect of low-frequency noise on resistance converter of teraommeters to test cable insulation. A mathematical pendulum was used to simulate low frequency electromagnetic interference. It was found that the greatest effect is exerted by dynamic effects of electrostatic charges that accumulate on the printed circuit board, electronic components, structural elements of the resistance-to-voltage converter, and on the test cable sheath. The effect of constant and alternating magnetic fields on measurement of resistance of insulating materials is insignificant.
AB - The study focuses on the effect of low-frequency noise on resistance converter of teraommeters to test cable insulation. A mathematical pendulum was used to simulate low frequency electromagnetic interference. It was found that the greatest effect is exerted by dynamic effects of electrostatic charges that accumulate on the printed circuit board, electronic components, structural elements of the resistance-to-voltage converter, and on the test cable sheath. The effect of constant and alternating magnetic fields on measurement of resistance of insulating materials is insignificant.
KW - Cable
KW - Electrostatic charge
KW - Insulation resistance
KW - Interference
KW - Mathematical pendulum
KW - Resistance-to-voltage converter
UR - http://www.scopus.com/inward/record.url?scp=85073265831&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85073265831&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/MSF.970.297
DO - 10.4028/www.scientific.net/MSF.970.297
M3 - Article
AN - SCOPUS:85073265831
VL - 970
SP - 297
EP - 304
JO - Materials Science Forum
JF - Materials Science Forum
SN - 0255-5476
ER -