STUDY OF DEFORMED SAMPLES USING AN INTERFEROMETER ATTACHED TO THE SAMPLE.

V. A. Zhilkin, S. I. Gerasimov

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Abstract

It is suggested that holographic interference patterns recorded in oppositely directed beams as proposed by Yu. N. Denisyuk be used to study static problems in the mechanics of deformed samples. The photographic plates are attached to the surface of the sample on top of an intermediate optically transparent material. The effects of the rigidity of the photographic plate and optically transparent material on the measured deformations and the vibrational noise reaching the photographic plate are estimated. Equations are derived which relate the displacements of points on the deformed sample surface to the difference in path lengths of the interfering waves. The method is illustrated by considering the deformed state of a spherically stressed sample using a slit condenser.

Original languageEnglish
Pages (from-to)1276-1279
Number of pages4
JournalSoviet physics. Technical physics
Volume27
Issue number10
Publication statusPublished - Oct 1982

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ASJC Scopus subject areas

  • Engineering(all)

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