Structural levels of plastic deformation and fracture of coated materials under different schemes of external loading

S. V. Panin, A. Yu Bydzan, Sh A. Baibulatov, N. N. Korobkina

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The paper reports on results of experimental investigations of mesoscale plastic deformation development in coated and surface-hardened materials. Plastic flow evolution under different schemes of loading is considered from structural levels of plastic deformation and failure point of view. It is shown that coating-substrate interface under loading is the site of powerful stress concentrators emergence whose action results in formation of localized deformation bands, cracks and, finally, material failure.

Original languageEnglish
Title of host publication5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages277-280
Number of pages4
Volume1
ISBN (Print)0780370082, 9780780370081
DOIs
Publication statusPublished - 2001
Event5th Korea-Russia International Symposium on Science and Technology, KORUS 2001 - Tomsk, Russian Federation
Duration: 26 Jun 20013 Jul 2001

Other

Other5th Korea-Russia International Symposium on Science and Technology, KORUS 2001
CountryRussian Federation
CityTomsk
Period26.6.013.7.01

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Keywords

  • coating
  • displacement vector field
  • image analysis
  • physical mesomechanics
  • stress concentrator

ASJC Scopus subject areas

  • Clinical Biochemistry
  • Computer Networks and Communications
  • Biotechnology
  • Civil and Structural Engineering
  • Mechanics of Materials
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Surfaces, Coatings and Films

Cite this

Panin, S. V., Bydzan, A. Y., Baibulatov, S. A., & Korobkina, N. N. (2001). Structural levels of plastic deformation and fracture of coated materials under different schemes of external loading. In 5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001 (Vol. 1, pp. 277-280). [975123] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/KORUS.2001.975123