Abstract
The paper addresses the results of the analysis of the structural features of nitrogen-containing titanium oxides films, deposited by reactive magnetron sputtering. The films have a nanocrystalline two-phase structure and consist of anatase and rutile crystallites, regardless of the coating deposition regimes. No traces of titanium nitride phase are found in the film and nitrogen atoms in oxide form are localized at the grain boundaries of the deposited film.
| Original language | English |
|---|---|
| Article number | 012062 |
| Journal | Journal of Physics: Conference Series |
| Volume | 1281 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 12 Aug 2019 |
| Event | 14th International Conference on Films and Coatings, ICFC 2019 - Saint Petersburg, Russian Federation Duration: 14 May 2019 → 16 May 2019 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
Cite this
Structural features and nitrogen positions in titanium oxynitride films grown in plasma of magnetron discharge. / Pichugin, V. F.; Pustovalova, A. A.; Evdokimov, K. E.; Konishchev, M. E.; Kuzmin, O. S.; Boytsova, E. L.; Beshchasna, Nataliia; Ficai, Anton; Aubakirova, D. M.; Sun, Zhilei.
In: Journal of Physics: Conference Series, Vol. 1281, No. 1, 012062, 12.08.2019.Research output: Contribution to journal › Conference article
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TY - JOUR
T1 - Structural features and nitrogen positions in titanium oxynitride films grown in plasma of magnetron discharge
AU - Pichugin, V. F.
AU - Pustovalova, A. A.
AU - Evdokimov, K. E.
AU - Konishchev, M. E.
AU - Kuzmin, O. S.
AU - Boytsova, E. L.
AU - Beshchasna, Nataliia
AU - Ficai, Anton
AU - Aubakirova, D. M.
AU - Sun, Zhilei
PY - 2019/8/12
Y1 - 2019/8/12
N2 - The paper addresses the results of the analysis of the structural features of nitrogen-containing titanium oxides films, deposited by reactive magnetron sputtering. The films have a nanocrystalline two-phase structure and consist of anatase and rutile crystallites, regardless of the coating deposition regimes. No traces of titanium nitride phase are found in the film and nitrogen atoms in oxide form are localized at the grain boundaries of the deposited film.
AB - The paper addresses the results of the analysis of the structural features of nitrogen-containing titanium oxides films, deposited by reactive magnetron sputtering. The films have a nanocrystalline two-phase structure and consist of anatase and rutile crystallites, regardless of the coating deposition regimes. No traces of titanium nitride phase are found in the film and nitrogen atoms in oxide form are localized at the grain boundaries of the deposited film.
UR - http://www.scopus.com/inward/record.url?scp=85072163703&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85072163703&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/1281/1/012062
DO - 10.1088/1742-6596/1281/1/012062
M3 - Conference article
AN - SCOPUS:85072163703
VL - 1281
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
SN - 1742-6588
IS - 1
M1 - 012062
ER -