Structural evolution of silumin treated with a high-intensity pulse electron beam and subsequent fatigue loading up to failure

V. E. Gromov, Yu F. Ivanov, A. M. Glezer, S. V. Konovalov, K. V. Alsaraeva

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The structural-phase states and defect substructure of silumin subjected to high-intensity electron beam irradiation in different modes and subsequent fatigue loading up to failure are analyzed via scanning and transmission electron diffraction microscopy. It is found that the sources of fatigue microcracks are micronand submicron-sized silicon plates that remain undissolved during electron-beam treatment. Possible reasons for the longer fatigue life of silumin after electron-beam treatment are discussed.

Original languageEnglish
Pages (from-to)1169-1172
Number of pages4
JournalBulletin of the Russian Academy of Sciences: Physics
Volume79
Issue number9
DOIs
Publication statusPublished - 29 Sep 2015

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electron beams
pulses
fatigue life
microcracks
substructures
electron diffraction
microscopy
irradiation
scanning
defects
silicon

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Structural evolution of silumin treated with a high-intensity pulse electron beam and subsequent fatigue loading up to failure. / Gromov, V. E.; Ivanov, Yu F.; Glezer, A. M.; Konovalov, S. V.; Alsaraeva, K. V.

In: Bulletin of the Russian Academy of Sciences: Physics, Vol. 79, No. 9, 29.09.2015, p. 1169-1172.

Research output: Contribution to journalArticle

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