Structural and phase transformations in Ti-B4C system formed when melting the composition film/substrate by an intense electron beam

Yu F. Ivanov, O. L. Khasanov, Z. G. Bikbaeva, M. S. Petyukevich, A. D. Teresov, V. V. Shugurov, O. V. Ivanova, A. A. Klopotov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The "(Ti) film/(B4C ceramics) substrate" system was investigated after irradiation by an intense pulse electron beam. It was found that the multiphase structure crystallized on the eutectic reaction was formed in the surface layer of the film/substrate system. It was shown that high-speed metallization of the surface layer in the B4C ceramics leads to increase of its fracture toughness.

Original languageEnglish
Title of host publicationAdvanced Materials for Technical and Medical Purpose
PublisherTrans Tech Publications Ltd
Pages76-80
Number of pages5
Volume712
ISBN (Print)9783035710649
DOIs
Publication statusPublished - 2016
EventWorkshop on Advanced Materials for Technical and Medical Purpose, AMTMP-2016 - Tomsk, Russian Federation
Duration: 15 Feb 201617 Feb 2016

Publication series

NameKey Engineering Materials
Volume712
ISSN (Print)10139826

Conference

ConferenceWorkshop on Advanced Materials for Technical and Medical Purpose, AMTMP-2016
CountryRussian Federation
CityTomsk
Period15.2.1617.2.16

    Fingerprint

Keywords

  • BC ceramics
  • Film/substrate
  • Intense electron beam
  • Metallization
  • Modification of structure and properties

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Ivanov, Y. F., Khasanov, O. L., Bikbaeva, Z. G., Petyukevich, M. S., Teresov, A. D., Shugurov, V. V., ... Klopotov, A. A. (2016). Structural and phase transformations in Ti-B4C system formed when melting the composition film/substrate by an intense electron beam. In Advanced Materials for Technical and Medical Purpose (Vol. 712, pp. 76-80). (Key Engineering Materials; Vol. 712). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/KEM.712.76