Statistical Regularity in LTD Technology

A. A. Kim, V. M. Alexeenko, S. S. Kondratiev, V. A. Sinebrukhov

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    In the report we describe statistical simulation of the closure delay of the spark gap switch that was performed by using the standard OrCAD software [1]. Simulation indicates that the jitter of LTD cavity including some number of the bricks, each with its own spark gap switch, might be expressed as a function of the switch jitter and the brick number. That leads to the conclusion the more cavities includes some group of interest (like single LTD module, multi-module LTD driver, or any other cavity group of interest), the less is the jitter of the output pulse of that group.

    Original languageEnglish
    Title of host publicationProceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages70-73
    Number of pages4
    ISBN (Electronic)9781538668900
    DOIs
    Publication statusPublished - 2 Nov 2018
    Event20th International Symposium on High-Current Electronics, ISHCE 2018 - Tomsk, Russian Federation
    Duration: 16 Sep 201822 Sep 2018

    Conference

    Conference20th International Symposium on High-Current Electronics, ISHCE 2018
    CountryRussian Federation
    CityTomsk
    Period16.9.1822.9.18

    Fingerprint

    Jitter
    regularity
    spark gaps
    switches
    bricks
    Switches
    Brick
    Electric sparks
    vibration
    cavities
    modules
    closures
    simulation
    computer programs
    output
    pulses

    Keywords

    • Linear transformer driver (LTD)
    • spark gap switch
    • standard deviation (jitter)

    ASJC Scopus subject areas

    • Safety, Risk, Reliability and Quality
    • Instrumentation
    • Electrical and Electronic Engineering

    Cite this

    Kim, A. A., Alexeenko, V. M., Kondratiev, S. S., & Sinebrukhov, V. A. (2018). Statistical Regularity in LTD Technology. In Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018 (pp. 70-73). [8521228] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISHCE.2018.8521228

    Statistical Regularity in LTD Technology. / Kim, A. A.; Alexeenko, V. M.; Kondratiev, S. S.; Sinebrukhov, V. A.

    Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 70-73 8521228.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Kim, AA, Alexeenko, VM, Kondratiev, SS & Sinebrukhov, VA 2018, Statistical Regularity in LTD Technology. in Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018., 8521228, Institute of Electrical and Electronics Engineers Inc., pp. 70-73, 20th International Symposium on High-Current Electronics, ISHCE 2018, Tomsk, Russian Federation, 16.9.18. https://doi.org/10.1109/ISHCE.2018.8521228
    Kim AA, Alexeenko VM, Kondratiev SS, Sinebrukhov VA. Statistical Regularity in LTD Technology. In Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 70-73. 8521228 https://doi.org/10.1109/ISHCE.2018.8521228
    Kim, A. A. ; Alexeenko, V. M. ; Kondratiev, S. S. ; Sinebrukhov, V. A. / Statistical Regularity in LTD Technology. Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 70-73
    @inproceedings{371f106e9c4f447c834611e19e59fdf1,
    title = "Statistical Regularity in LTD Technology",
    abstract = "In the report we describe statistical simulation of the closure delay of the spark gap switch that was performed by using the standard OrCAD software [1]. Simulation indicates that the jitter of LTD cavity including some number of the bricks, each with its own spark gap switch, might be expressed as a function of the switch jitter and the brick number. That leads to the conclusion the more cavities includes some group of interest (like single LTD module, multi-module LTD driver, or any other cavity group of interest), the less is the jitter of the output pulse of that group.",
    keywords = "Linear transformer driver (LTD), spark gap switch, standard deviation (jitter)",
    author = "Kim, {A. A.} and Alexeenko, {V. M.} and Kondratiev, {S. S.} and Sinebrukhov, {V. A.}",
    year = "2018",
    month = "11",
    day = "2",
    doi = "10.1109/ISHCE.2018.8521228",
    language = "English",
    pages = "70--73",
    booktitle = "Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018",
    publisher = "Institute of Electrical and Electronics Engineers Inc.",
    address = "United States",

    }

    TY - GEN

    T1 - Statistical Regularity in LTD Technology

    AU - Kim, A. A.

    AU - Alexeenko, V. M.

    AU - Kondratiev, S. S.

    AU - Sinebrukhov, V. A.

    PY - 2018/11/2

    Y1 - 2018/11/2

    N2 - In the report we describe statistical simulation of the closure delay of the spark gap switch that was performed by using the standard OrCAD software [1]. Simulation indicates that the jitter of LTD cavity including some number of the bricks, each with its own spark gap switch, might be expressed as a function of the switch jitter and the brick number. That leads to the conclusion the more cavities includes some group of interest (like single LTD module, multi-module LTD driver, or any other cavity group of interest), the less is the jitter of the output pulse of that group.

    AB - In the report we describe statistical simulation of the closure delay of the spark gap switch that was performed by using the standard OrCAD software [1]. Simulation indicates that the jitter of LTD cavity including some number of the bricks, each with its own spark gap switch, might be expressed as a function of the switch jitter and the brick number. That leads to the conclusion the more cavities includes some group of interest (like single LTD module, multi-module LTD driver, or any other cavity group of interest), the less is the jitter of the output pulse of that group.

    KW - Linear transformer driver (LTD)

    KW - spark gap switch

    KW - standard deviation (jitter)

    UR - http://www.scopus.com/inward/record.url?scp=85058096385&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=85058096385&partnerID=8YFLogxK

    U2 - 10.1109/ISHCE.2018.8521228

    DO - 10.1109/ISHCE.2018.8521228

    M3 - Conference contribution

    AN - SCOPUS:85058096385

    SP - 70

    EP - 73

    BT - Proceedings - 2018 20th International Symposium on High-Current Electronics, ISHCE 2018

    PB - Institute of Electrical and Electronics Engineers Inc.

    ER -