Abstract
TiZr-based multicomponent metallic films composed of 3-5 constituents with almost equal atomic concentrations were prepared by co-sputtering of pure metallic targets in an Ar atmosphere. X-ray diffraction was employed to determine phase composition, crystalline structure, lattice parameters, texture and crystallite size of the deposited films.The deposited films exhibited only solid solution (fcc, bcc or hcp) or amorphous phases, no intermetallic components being detected. It was found that the hcp structure was stabilized by the presence of Hf or Y, bcc by Nb or Al and fcc by Cu. For the investigated films, the atomic size difference, mixing enthalpy, mixing entropy, Gibbs free energy of mixing and the electronegativity difference for solid solution and amorphous phases were calculated based on Miedema's approach of the regular solution model. It was shown that the atomic size difference and the ratio between the Gibbs free energies of mixing of the solid solution and amorphous phases were the most significant parameters controlling the film crystallinity.
| Original language | English |
|---|---|
| Pages (from-to) | 305-312 |
| Number of pages | 8 |
| Journal | Progress in Natural Science: Materials International |
| Volume | 24 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1 Jan 2014 |
| Externally published | Yes |
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Keywords
- Magnetron sputtering
- Multicomponent metallic films
- TiZr-based high-entropy alloys
- X-ray diffraction
ASJC Scopus subject areas
- General
Cite this
Solid solution or amorphous phase formation in TiZr-based ternary to quinternary multi-principal-element films. / Braic, Mariana; Braic, Viorel; Vladescu, Alina; Zoita, Catalin N.; Balaceanu, Mihai.
In: Progress in Natural Science: Materials International, Vol. 24, No. 4, 01.01.2014, p. 305-312.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Solid solution or amorphous phase formation in TiZr-based ternary to quinternary multi-principal-element films
AU - Braic, Mariana
AU - Braic, Viorel
AU - Vladescu, Alina
AU - Zoita, Catalin N.
AU - Balaceanu, Mihai
PY - 2014/1/1
Y1 - 2014/1/1
N2 - TiZr-based multicomponent metallic films composed of 3-5 constituents with almost equal atomic concentrations were prepared by co-sputtering of pure metallic targets in an Ar atmosphere. X-ray diffraction was employed to determine phase composition, crystalline structure, lattice parameters, texture and crystallite size of the deposited films.The deposited films exhibited only solid solution (fcc, bcc or hcp) or amorphous phases, no intermetallic components being detected. It was found that the hcp structure was stabilized by the presence of Hf or Y, bcc by Nb or Al and fcc by Cu. For the investigated films, the atomic size difference, mixing enthalpy, mixing entropy, Gibbs free energy of mixing and the electronegativity difference for solid solution and amorphous phases were calculated based on Miedema's approach of the regular solution model. It was shown that the atomic size difference and the ratio between the Gibbs free energies of mixing of the solid solution and amorphous phases were the most significant parameters controlling the film crystallinity.
AB - TiZr-based multicomponent metallic films composed of 3-5 constituents with almost equal atomic concentrations were prepared by co-sputtering of pure metallic targets in an Ar atmosphere. X-ray diffraction was employed to determine phase composition, crystalline structure, lattice parameters, texture and crystallite size of the deposited films.The deposited films exhibited only solid solution (fcc, bcc or hcp) or amorphous phases, no intermetallic components being detected. It was found that the hcp structure was stabilized by the presence of Hf or Y, bcc by Nb or Al and fcc by Cu. For the investigated films, the atomic size difference, mixing enthalpy, mixing entropy, Gibbs free energy of mixing and the electronegativity difference for solid solution and amorphous phases were calculated based on Miedema's approach of the regular solution model. It was shown that the atomic size difference and the ratio between the Gibbs free energies of mixing of the solid solution and amorphous phases were the most significant parameters controlling the film crystallinity.
KW - Magnetron sputtering
KW - Multicomponent metallic films
KW - TiZr-based high-entropy alloys
KW - X-ray diffraction
UR - http://www.scopus.com/inward/record.url?scp=84926422146&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84926422146&partnerID=8YFLogxK
U2 - 10.1016/j.pnsc.2014.06.001
DO - 10.1016/j.pnsc.2014.06.001
M3 - Article
VL - 24
SP - 305
EP - 312
JO - Progress in Natural Science: Materials International
JF - Progress in Natural Science: Materials International
SN - 1002-0071
IS - 4
ER -