Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range

Sergey Makarov, Sergey Pikuz, Sergey Ryazantsev, Tatiana Pikuz, Alexey Buzmakov, Max Rose, Sergey Lazarev, Tobias Senkbeil, Andreas Von Gundlach, Susan Stuhr, Christoph Rumancev, Dmitry Dzhigaev, Petr Skopintsev, Ivan Zaluzhnyy, Jens Viefhaus, Axel Rosenhahn, Ryosuke Kodama, Ivan A. Vartanyants

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

The unique diagnostic possibilities of X-ray diffraction, small X-ray scattering and phase-contrast imaging techniques applied with high-intensity coherent X-ray synchrotron and X-ray free-electron laser radiation can only be fully realized if a sufficient dynamic range and/or spatial resolution of the detector is available. In this work, it is demonstrated that the use of lithium fluoride (LiF) as a photoluminescence (PL) imaging detector allows measuring of an X-ray diffraction image with a dynamic range of ∼107 within the sub-micrometre spatial resolution. At the PETRA III facility, the diffraction pattern created behind a circular aperture with a diameter of 5μm irradiated by a beam with a photon energy of 500eV was recorded on a LiF crystal. In the diffraction pattern, the accumulated dose was varied from 1.7 × 105Jcm-3 in the central maximum to 2 × 10-2Jcm-3 in the 16th maximum of diffraction fringes. The period of the last fringe was measured with 0.8μm width. The PL response of the LiF crystal being used as a detector on the irradiation dose of 500eV photons was evaluated. For the particular model of laser-scanning confocal microscope Carl Zeiss LSM700, used for the readout of the PL signal, the calibration dependencies on the intensity of photopumping (excitation) radiation (λ = 488nm) and the gain have been obtained.

Original languageEnglish
Pages (from-to)625-632
Number of pages8
JournalJournal of Synchrotron Radiation
Volume27
DOIs
Publication statusPublished - 1 May 2020

Keywords

  • Color centers
  • Diffraction patterns
  • LiF detectors

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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