Soft-x-ray Cherenkov radiation generated by a charged particle moving near a finite-size screen

M. Shevelev, A. Konkov, A. Aryshev

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13 Citations (Scopus)

Abstract

This paper demonstrates the application of a polarization current approach to estimate the yield of soft x-ray Cherenkov radiation when a charged particle travels in the vicinity of a finite-size screen. To account for resonant anomalous dispersion of the complex permittivity, we apply the formalism for the atomic scattering factor. We derived the simple analytical expression for the radiation field, which allows us to determine all properties for a wide energy range of emitted radiation of a charged particle. The influence of screen sizes on Cherenkov radiation characteristics is determined by macroscopic and microscopic approaches.

Original languageEnglish
Article number053851
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume92
Issue number5
DOIs
Publication statusPublished - 23 Nov 2015

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charged particles
radiation
x rays
radiation distribution
travel
permittivity
formalism
polarization
estimates
scattering
energy

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

@article{77aabed634814b0b8d96637c2b4ed211,
title = "Soft-x-ray Cherenkov radiation generated by a charged particle moving near a finite-size screen",
abstract = "This paper demonstrates the application of a polarization current approach to estimate the yield of soft x-ray Cherenkov radiation when a charged particle travels in the vicinity of a finite-size screen. To account for resonant anomalous dispersion of the complex permittivity, we apply the formalism for the atomic scattering factor. We derived the simple analytical expression for the radiation field, which allows us to determine all properties for a wide energy range of emitted radiation of a charged particle. The influence of screen sizes on Cherenkov radiation characteristics is determined by macroscopic and microscopic approaches.",
author = "M. Shevelev and A. Konkov and A. Aryshev",
year = "2015",
month = "11",
day = "23",
doi = "10.1103/PhysRevA.92.053851",
language = "English",
volume = "92",
journal = "Physical Review A",
issn = "1050-2947",
publisher = "American Physical Society",
number = "5",

}

TY - JOUR

T1 - Soft-x-ray Cherenkov radiation generated by a charged particle moving near a finite-size screen

AU - Shevelev, M.

AU - Konkov, A.

AU - Aryshev, A.

PY - 2015/11/23

Y1 - 2015/11/23

N2 - This paper demonstrates the application of a polarization current approach to estimate the yield of soft x-ray Cherenkov radiation when a charged particle travels in the vicinity of a finite-size screen. To account for resonant anomalous dispersion of the complex permittivity, we apply the formalism for the atomic scattering factor. We derived the simple analytical expression for the radiation field, which allows us to determine all properties for a wide energy range of emitted radiation of a charged particle. The influence of screen sizes on Cherenkov radiation characteristics is determined by macroscopic and microscopic approaches.

AB - This paper demonstrates the application of a polarization current approach to estimate the yield of soft x-ray Cherenkov radiation when a charged particle travels in the vicinity of a finite-size screen. To account for resonant anomalous dispersion of the complex permittivity, we apply the formalism for the atomic scattering factor. We derived the simple analytical expression for the radiation field, which allows us to determine all properties for a wide energy range of emitted radiation of a charged particle. The influence of screen sizes on Cherenkov radiation characteristics is determined by macroscopic and microscopic approaches.

UR - http://www.scopus.com/inward/record.url?scp=84948439320&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84948439320&partnerID=8YFLogxK

U2 - 10.1103/PhysRevA.92.053851

DO - 10.1103/PhysRevA.92.053851

M3 - Article

VL - 92

JO - Physical Review A

JF - Physical Review A

SN - 1050-2947

IS - 5

M1 - 053851

ER -