Soft component of emission from channeled electrons in a silicon crystal

I. E. Vnukov, B. N. Kalinin, A. A. Kiryakov, G. A. Naumenko, D. V. Padalko, A. P. Potylitsyn

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The Tomsk synchrotron has been used to measure the emission spectrum and orientation dependences of the yield of photons with energies much smaller than the emission energy of channeled electrons. The measurements have been performed with a crystal-diffraction spectrometer. For electrons incident along the (110) axis, the radiation intensity in the energy range 30 ≤ ω ≤ 360 keV exceeds the bremsstrahlung one by almost an order of magnitude. The shape of the emission spectrum does not coincide with that of the bremsstrahlung spectrum. The radiation intensity increases smoothly with the photon energy. The bremsstrahlung spectrum from a disoriented crystalline target is satisfactorily described by the existing theory with phenomenological consideration of the polarization of the medium.

Original languageEnglish
Pages (from-to)281-291
Number of pages11
JournalRussian Physics Journal
Volume44
Issue number3
DOIs
Publication statusPublished - 1 Jan 2001

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bremsstrahlung
silicon
crystals
radiant flux density
emission spectra
electrons
energy
photons
synchrotrons
spectrometers
polarization
diffraction

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Soft component of emission from channeled electrons in a silicon crystal. / Vnukov, I. E.; Kalinin, B. N.; Kiryakov, A. A.; Naumenko, G. A.; Padalko, D. V.; Potylitsyn, A. P.

In: Russian Physics Journal, Vol. 44, No. 3, 01.01.2001, p. 281-291.

Research output: Contribution to journalArticle

Vnukov, I. E. ; Kalinin, B. N. ; Kiryakov, A. A. ; Naumenko, G. A. ; Padalko, D. V. ; Potylitsyn, A. P. / Soft component of emission from channeled electrons in a silicon crystal. In: Russian Physics Journal. 2001 ; Vol. 44, No. 3. pp. 281-291.
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