Simulation of the Sample Alignment Process for the White Beam Tomography

Research output: Contribution to journalConference articlepeer-review

Abstract

Nowadays growth of synthetic crystals is a very prospective direction of research activity. However, it is well known that in synthesized crystals there are still many defects and the main idea is to synthesize crystal of ideal form and structure. But in purpose to remove defects first you have to characterize them. This paper describes the method for the characterization of such defects and mainly concentrates on the problem of sample alignment procedure, offering the way to avoid misalignments.

Original languageEnglish
Article number012039
JournalIOP Conference Series: Materials Science and Engineering
Volume142
Issue number1
DOIs
Publication statusPublished - 2 Sep 2016
Event7th International Scientific Practical Conference on Innovative Technologies in Engineering - Yurga, Russian Federation
Duration: 19 May 201621 May 2016

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

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