Simulation of the microtron electron beam profile formation using flattening filters

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7 Citations (Scopus)

Abstract

The development of new modern methods of electron beam profile forming becomes an important problem with the expansion of the application spectrum of electrons, both in industry and in medicine. This paper presents the results of a numerical simulation of the electron beam profile formed by flattening filters of different materials (aluminum and ABS-plastic). The model corresponding to the actual beam was developed based on the experimental estimation of shape and profile of the extracted microtron electron beam. Next, the geometry of flattening filters made of aluminum and ABS-plastic was calculated, and the electron beam profile was theoretically analyzed.

Original languageEnglish
Pages (from-to)890-892
Number of pages3
JournalPhysics of Particles and Nuclei Letters
Volume13
Issue number7
DOIs
Publication statusPublished - 1 Dec 2016

ASJC Scopus subject areas

  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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